Login / Signup
Franck Julien
Publication Activity (10 Years)
Years Active: 2011-2022
Publications (10 Years): 5
Top Topics
Cmos Technology
Power Reduction
Functional Decomposition
Spl Times
Top Venues
PATMOS
MWSCAS
ICECS 2022
ISCAS
</>
Publications
</>
Paul Devoge
,
Hassen Aziza
,
Philippe Lorenzini
,
Alexandre Malherbe
,
Franck Julien
,
Abderrezak Marzaki
,
Arnaud Régnier
,
Stephan Niel
Digital-to-analog converters to benchmark the matching performance of a new zero-cost transistor.
ISCAS
(2022)
Paul Devoge
,
Hassen Aziza
,
Philippe Lorenzini
,
Pascal Masson
,
Alexandre Malherbe
,
Franck Julien
,
Abderrezak Marzaki
,
Arnaud Régnier
,
Stephan Niel
A Schmitt trigger to benchmark the performance of a new zero-cost transistor.
ICECS 2022
(2022)
Paul Devoge
,
Hassen Aziza
,
Philippe Lorenzini
,
Franck Julien
,
Abderrezak Marzaki
,
Alexandre Malherbe
,
Marc Mantelli
,
Thomas Sardin
,
Sébastien Haendler
,
Arnaud Régnier
,
Stephan Niel
Circuit-level evaluation of a new zero-cost transistor in an embedded non-volatile memory CMOS technology.
DTIS
(2021)
Jordan Innocenti
,
Franck Julien
,
Jean-Michel Portal
,
Laurent Lopez
,
Q. Hubert
,
Pascal Masson
,
Jacques Sonzogni
,
Stephan Niel
,
Arnaud Régnier
Layout optimizations to decrease internal power and area in digital CMOS standard cells.
MIPRO
(2015)
Jordan Innocenti
,
Loïc Welter
,
Nicolas Borrel
,
Franck Julien
,
Jean-Michel Portal
,
Jacques Sonzogni
,
Laurent Lopez
,
Pascal Masson
,
Stephan Niel
,
Philippe Dreux
,
Julia Castellan
Dynamic current reduction of CMOS digital circuits through design and process optimization.
PATMOS
(2015)
Jordan Innocenti
,
Loic Welter
,
Franck Julien
,
Laurent Lopez
,
Jacques Sonzogni
,
Stephan Niel
,
Arnaud Régnier
,
Emmanuel Paire
,
Karen Labory
,
Eric Denis
,
Jean-Michel Portal
,
Pascal Masson
Dynamic power reduction through process and design optimizations on CMOS 80 nm embedded non-volatile memories technology.
MWSCAS
(2014)
Y. Joly
,
L. Truphemus
,
Laurent Lopez
,
Jean-Michel Portal
,
Hassen Aziza
,
Franck Julien
,
Pascal Fornara
Temperature and hump effect impact on output voltage spread of low power bandgap designed in the sub-threshold area.
ISCAS
(2011)
Y. Joly
,
Laurent Lopez
,
Jean-Michel Portal
,
Hassen Aziza
,
Jean-Luc Ogier
,
Y. Bert
,
Franck Julien
,
Pascal Fornara
Matching degradation of threshold voltage and gate voltage of NMOSFET after Hot Carrier Injection stress.
Microelectron. Reliab.
51 (9-11) (2011)