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Matching degradation of threshold voltage and gate voltage of NMOSFET after Hot Carrier Injection stress.

Y. JolyLaurent LopezJean-Michel PortalHassen AzizaJean-Luc OgierY. BertFranck JulienPascal Fornara
Published in: Microelectron. Reliab. (2011)
Keyphrases
  • power system
  • electric field
  • field effect transistors
  • high voltage
  • low voltage
  • power supply
  • short circuit
  • silicon dioxide
  • reactive power
  • image matching
  • graph matching
  • image sequences
  • matching process
  • power losses