POWER LOSSES
Experts
- Massoud Pedram
- Sachin S. Sapatnekar
- Vivek De
- Massimo Alioto
- Taewhan Kim
- Nuno Horta
- Saibal Mukhopadhyay
- Ricardo Martins
- Takayasu Sakurai
- N. Ranganathan
- Cheng-Kok Koh
- Nuno Lourenço
- Shih-Chieh Chang
- Enrico Macii
- Nagarajan Ranganathan
- Xianlong Hong
- David Z. Pan
- Miodrag Potkonjak
- Hidetoshi Onodera
- Majid Sarrafzadeh
- Yici Cai
- Arvind Singh
- Malgorzata Marek-Sadowska
- Jason Cong
- Yao-Wen Chang
- Kashem M. Muttaqi
- Sheldon X.-D. Tan
- Maurizio Paschero
- Marian K. Kazimierczuk
- Luca Benini
- Frede Blaabjerg
- Lawrence Cohen
- Huei Peng
- Petru Eles
- Gang Qu
- Antonello Rizzi
- Josep M. Guerrero
- Eby G. Friedman
- Benton H. Calhoun
Venues
- IEEE Trans. Ind. Electron.
- IEEE Access
- IECON
- CoRR
- ISCAS
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Very Large Scale Integr. Syst.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Trans. Smart Grid
- DAC
- IEEE J. Solid State Circuits
- ICCAD
- DATE
- IEEE Trans. Circuits Syst. II Express Briefs
- ISLPED
- IAS
- ICECS
- VLSI Design
- ISQED
- MWSCAS
- Microelectron. J.
- Microelectron. Reliab.
- ISSCC
- ASP-DAC
- J. Circuits Syst. Comput.
- ACM Great Lakes Symposium on VLSI
- CICC
- Int. J. Circuit Theory Appl.
- ICCD
- Sensors
- ISIE
- ACM Trans. Design Autom. Electr. Syst.
- IEICE Electron. Express
- IEEE Trans. Veh. Technol.
- SBCCI
- J. Low Power Electron.
- Integr.
- CDC
- ESSCIRC
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