POWER LOSSES
Experts
- Massoud Pedram
- Vivek De
- Sachin S. Sapatnekar
- Massimo Alioto
- Taewhan Kim
- Saibal Mukhopadhyay
- Ricardo Martins
- Nuno Horta
- N. Ranganathan
- Hidetoshi Onodera
- David Z. Pan
- Miodrag Potkonjak
- Shih-Chieh Chang
- Cheng-Kok Koh
- Nuno Lourenço
- Majid Sarrafzadeh
- Yici Cai
- Xianlong Hong
- Takayasu Sakurai
- Enrico Macii
- Arvind Singh
- Nagarajan Ranganathan
- David T. Blaauw
- Josep M. Guerrero
- Frede Blaabjerg
- Yao-Wen Chang
- Jason Cong
- Benton H. Calhoun
- Marian K. Kazimierczuk
- Malgorzata Marek-Sadowska
- Huei Peng
- Luca Benini
- Monodeep Kar
- Kashem M. Muttaqi
- Juho Kim
- Gang Qu
- Sheldon X.-D. Tan
- Lawrence Cohen
- Eby G. Friedman
Venues
- IEEE Trans. Ind. Electron.
- IEEE Access
- IECON
- CoRR
- ISCAS
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Very Large Scale Integr. Syst.
- IEEE Trans. Smart Grid
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- DAC
- IEEE J. Solid State Circuits
- ICCAD
- DATE
- IEEE Trans. Circuits Syst. II Express Briefs
- ISLPED
- IAS
- ICECS
- ISQED
- VLSI Design
- Microelectron. J.
- MWSCAS
- Microelectron. Reliab.
- ISSCC
- ASP-DAC
- J. Circuits Syst. Comput.
- ACM Great Lakes Symposium on VLSI
- CICC
- Int. J. Circuit Theory Appl.
- Sensors
- ICCD
- ACM Trans. Design Autom. Electr. Syst.
- ISIE
- IEEE Trans. Veh. Technol.
- IEICE Electron. Express
- IRPS
- ESSCIRC
- SBCCI
- CDC
- J. Low Power Electron.
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend