POWER LOSSES
Experts
- Massoud Pedram
- Vivek De
- Sachin S. Sapatnekar
- Massimo Alioto
- Taewhan Kim
- Saibal Mukhopadhyay
- Ricardo Martins
- Nuno Horta
- Enrico Macii
- Nagarajan Ranganathan
- Takayasu Sakurai
- Majid Sarrafzadeh
- Miodrag Potkonjak
- Hidetoshi Onodera
- David Z. Pan
- Nuno Lourenço
- Yici Cai
- Arvind Singh
- Xianlong Hong
- N. Ranganathan
- Shih-Chieh Chang
- Cheng-Kok Koh
- Malgorzata Marek-Sadowska
- David T. Blaauw
- Huei Peng
- Antonello Rizzi
- Luca Benini
- Josep M. Guerrero
- Eby G. Friedman
- Petru Eles
- Monodeep Kar
- Jason Cong
- Lawrence Cohen
- Benton H. Calhoun
- Juho Kim
- Gang Qu
- Marian K. Kazimierczuk
- Yao-Wen Chang
- Maurizio Paschero
Venues
- IEEE Trans. Ind. Electron.
- IEEE Access
- IECON
- CoRR
- IEEE Trans. Instrum. Meas.
- ISCAS
- IEEE Trans. Very Large Scale Integr. Syst.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Trans. Smart Grid
- DAC
- IEEE J. Solid State Circuits
- ICCAD
- DATE
- IEEE Trans. Circuits Syst. II Express Briefs
- ISLPED
- IAS
- ICECS
- VLSI Design
- ISQED
- MWSCAS
- Microelectron. Reliab.
- Microelectron. J.
- ASP-DAC
- CICC
- ACM Great Lakes Symposium on VLSI
- ISSCC
- Sensors
- J. Circuits Syst. Comput.
- ICCD
- Int. J. Circuit Theory Appl.
- ACM Trans. Design Autom. Electr. Syst.
- IEICE Electron. Express
- ISIE
- IEEE Trans. Veh. Technol.
- CDC
- SBCCI
- ESSCIRC
- IRPS
- J. Low Power Electron.
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