Pascal Masson

Publication Activity (10 Years)

Years Active: 2004-2023
Publications (10 Years): 6

Top Topics

Digital Circuits

Power Reduction

Metal Oxide Semiconductor

Top Venues

Publications

Lucas Antunes Tambara, Pascal Masson, Julien Amouroux, Stéphane Monfray, Julien Dura, Frederic Gianesello, Julien Babic, Romain Debroucke, Loic Welter, Siddhartha Dhar, Bernadette Gros, Clement Charbuillet, Franck Julien, Guillaume Bertrand, Arnaud Régnier, Alain Fleury
Notched gate MOSFET for capacitance reduction in RF SOI technology. DTTIS (2023)
Radouane Habhab, Vincenzo Della Marca, Pascal Masson, Nadia Miridi, Clement Pribat, Simon Jeannot, Thibault Kempf, Marc Mantelli, Philippe Lorenzini, Jean-Marc Voisin, Arnaud Régnier, Stephan Niel, Francesco La Rosa
40nm SONOS Embedded Select in Trench Memory. ESSDERC (2023)
Paul Devoge, Hassen Aziza, Philippe Lorenzini, Pascal Masson, Alexandre Malherbe, Franck Julien, Abderrezak Marzaki, Arnaud Régnier, Stephan Niel
A Schmitt trigger to benchmark the performance of a new zero-cost transistor. ICECS 2022 (2022)
T. Kempf, Vincenzo Della Marca, L. Baron, F. Maugain, F. La Rosa, Stephan Niel, Arnaud Régnier, Jean-Michel Portal, Pascal Masson
Threshold voltage bitmap analysis methodology: Application to a 512kB 40nm Flash memory test chip. IRPS (2018)
Jordan Innocenti, Franck Julien, Jean-Michel Portal, Laurent Lopez, Q. Hubert, Pascal Masson, Jacques Sonzogni, Stephan Niel, Arnaud Régnier
Layout optimizations to decrease internal power and area in digital CMOS standard cells. MIPRO (2015)
Jordan Innocenti, Loïc Welter, Nicolas Borrel, Franck Julien, Jean-Michel Portal, Jacques Sonzogni, Laurent Lopez, Pascal Masson, Stephan Niel, Philippe Dreux, Julia Castellan
Dynamic current reduction of CMOS digital circuits through design and process optimization. PATMOS (2015)
Benjamin Rebuffat, Pascal Masson, Jean-Luc Ogier, Marc Mantelli, Romain Laffont
Effect of AC stress on oxide TDDB and trapped charge in interface states. ISIC (2014)
Jordan Innocenti, Loic Welter, Franck Julien, Laurent Lopez, Jacques Sonzogni, Stephan Niel, Arnaud Régnier, Emmanuel Paire, Karen Labory, Eric Denis, Jean-Michel Portal, Pascal Masson
Dynamic power reduction through process and design optimizations on CMOS 80 nm embedded non-volatile memories technology. MWSCAS (2014)
Benjamin Rebuffat, Vincenzo Della Marca, Pascal Masson, Jean-Luc Ogier, Marc Mantelli, Olivier Paulet, Laurent Lopez, Romain Laffont
Effect of ions presence in the SiOCH inter metal dielectric structure. ESSDERC (2013)
R. Llido, Pascal Masson, Arnaud Régnier, Vincent Goubier, Gérald Haller, Vincent Pouget, Dean Lewis
Effects of 1064 nm laser on MOS capacitor. Microelectron. Reliab. 52 (9-10) (2012)
Philippe Chiquet, Pascal Masson, Romain Laffont, Gilles Micolau, Jérémy Postel-Pellerin, Frédéric Lalande, Bernard Bouteille, Jean-Luc Ogier
layers using dynamic measurement protocols. Microelectron. Reliab. 52 (9-10) (2012)
Guillaume Just, Vincenzo Della Marca, Arnaud Régnier, Jean-Luc Ogier, Jérémy Postel-Pellerin, Jean-Michel Portal, Pascal Masson
Effects of Lightly Doped Drain and Channel Doping Variations on Flash Memory Performances and Reliability. J. Low Power Electron. 8 (5) (2012)
B. Saillet, Arnaud Régnier, Jean-Michel Portal, B. Delsuc, Romain Laffont, Pascal Masson, Rachid Bouchakour
MM11 based flash memory cell model including characterization procedure. ISCAS (2006)
Fabien Gilibert, Denis Rideau, Alexandre Dray, Francois Agut, Michel Minondo, Andre Juge, Pascal Masson, Rachid Bouchakour
Characterization and Modeling of Gate-Induced-Drain-Leakage. IEICE Trans. Electron. (5) (2005)
Sandrine Bernardini, Jean-Michel Portal, Pascal Masson
A Tunneling Model for Gate Oxide Failure in Deep Sub-Micron Technology. DATE (2004)