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Threshold voltage bitmap analysis methodology: Application to a 512kB 40nm Flash memory test chip.

T. KempfVincenzo Della MarcaL. BaronF. MaugainF. La RosaStephan NielArnaud RégnierJean-Michel PortalPascal Masson
Published in: IRPS (2018)
Keyphrases
  • flash memory
  • databases
  • knowledge base
  • high speed
  • data management
  • embedded systems