Gérald Haller

Publication Activity (10 Years)

Years Active: 2002-2012
Publications (10 Years): 0

Top Topics

Transmission Electron Microscopy

Evolutionary Algorithm

Top Venues

Microelectron. Reliab.

Publications

R. Llido, Pascal Masson, Arnaud Régnier, Vincent Goubier, Gérald Haller, Vincent Pouget, Dean Lewis
Effects of 1064 nm laser on MOS capacitor. Microelectron. Reliab. 52 (9-10) (2012)
Roxane Llido, J. Gomez, Vincent Goubier, N. Froidevaux, L. Dufayard, Gérald Haller, Vincent Pouget, Dean Lewis
Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory. Microelectron. Reliab. 51 (9-11) (2011)
Gérald Haller, Aziz Machouat, Dean Lewis, Vincent Pouget
Net integrity checking by optical localization techniques. Microelectron. Reliab. 49 (9-11) (2009)
Julie Ferrigno, Aziz Machouat, Philippe Perdu, Dean Lewis, Gérald Haller, Vincent Goubier
Generic simulator for faulty IC. Microelectron. Reliab. 48 (8-9) (2008)
Aziz Machouat, Gérald Haller, Vincent Goubier, Dean Lewis, Philippe Perdu, Vincent Pouget, Pascal Fouillat, Fabien Essely
Effect of physical defect on shmoos in CMOS DSM technologies. Microelectron. Reliab. 48 (8-9) (2008)
Jérôme Adrian, N. Rodriguez, Fabien Essely, Gérald Haller, C. Grosjean, Alain Portavoce, C. Girardeaux
Investigation of a new method for dopant characterization. Microelectron. Reliab. 47 (9-11) (2007)
N. Rodriguez, Jérôme Adrian, C. Grosjean, Gérald Haller, C. Girardeaux, Alain Portavoce
Evaluation of scanning capacitance microscopy sample preparation by focused ion beam. Microelectron. Reliab. 46 (9-11) (2006)
Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat
Impact of semiconductors material on IR Laser Stimulation signal. Microelectron. Reliab. 45 (9-11) (2005)
Olivier Crépel, Patrick Poirier, Philippe Descamps, Romain Desplats, Philippe Perdu, Gérald Haller, Abdellatif Firiti
Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems. Microelectron. Reliab. 44 (9-11) (2004)
Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat
Understanding the effects of NIR laser stimulation on NMOS transistor. Microelectron. Reliab. 44 (9-11) (2004)
D. Martin, Romain Desplats, Gérald Haller, Pascal Nouet, Florence Azaïs
Automated Diagnosis and Probing Flow for Fast Fault Localization in IC. Microelectron. Reliab. 44 (9-11) (2004)
Abdellatif Firiti, D. Faujour, Gérald Haller, J. M. Moragues, Vincent Goubier, Philippe Perdu, Felix Beaudoin, Dean Lewis
Short defect characterization based on TCR parameter extraction. Microelectron. Reliab. 43 (9-11) (2003)
Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, Gérald Haller, Vincent Pouget, Dean Lewis
From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. Microelectron. Reliab. 43 (9-11) (2003)
Felix Beaudoin, Gérald Haller, Philippe Perdu, Romain Desplats, Thomas Beauchêne, Dean Lewis
Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. Microelectron. Reliab. 42 (9-11) (2002)
Olivier Crépel, Felix Beaudoin, Lionel Dantas de Morais, Gérald Haller, C. Goupil, Philippe Perdu, Romain Desplats, Dean Lewis
Backside Hot Spot Detection Using Liquid Crystal Microscopy. Microelectron. Reliab. 42 (9-11) (2002)