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Automated Diagnosis and Probing Flow for Fast Fault Localization in IC.
D. Martin
Romain Desplats
Gérald Haller
Pascal Nouet
Florence Azaïs
Published in:
Microelectron. Reliab. (2004)
Keyphrases
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fault localization
model based diagnosis
fault detection
program understanding
software testing
program slicing
data abstraction
diagnostic systems
fault isolation
neural network
dynamic systems
integrated circuit
databases
high level
relational databases