Florence Azaïs

Publication Activity (10 Years)

Years Active: 1995-2024
Publications (10 Years): 37

Top Venues

J. Electron. Test.

LATS

ETS

ISVLSI

Publications

Muayad J. Aljafar, Florence Azaïs, Marie-Lise Flottes, Samuel Pagliarini
Utilizing Layout Effects for Analog Logic Locking. CoRR (2024)
Thibault Vayssade, Florence Azaïs, Laurent Latorre, François Lefèvre
Low-cost digital solution for production test of ZigBee transmitters Special Session "AMS-RF testing". LATS (2023)
Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre
On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits. J. Electron. Test. 39 (2) (2023)
Muayad J. Aljafar, Florence Azaïs, Marie-Lise Flottes, Samuel Pagliarini
Leveraging Layout-based Effects for Locking Analog ICs. CoRR (2022)
Muayad J. Aljafar, Florence Azaïs, Marie-Lise Flottes, Samuel Pagliarini
Leveraging Layout-based Effects for Locking Analog ICs. ASHES@CCS (2022)
Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzèrho, François Lefèvre
Exploring on-line RF performance monitoring based on the indirect test strategy. LATS (2021)
Thibault Vayssade, Mouhamad Chehaitly, Florence Azaïs, Laurent Latorre, François Lefèvre
Exploration of a digital-based solution for the generation of 2.4GHz OQPSK test stimuli. ETS (2021)
T. Vayssade, Florence Azaïs, Laurent Latorre, François Lefèvre
Low-Cost EVM Measurement of ZigBee Transmitters From 1-bit Undersampled Acquisition. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40 (11) (2021)
Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre
Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit. J. Electron. Test. 37 (2) (2021)
Thibault Vayssade, Florence Azaïs, Laurent Latorre, François Lefèvre
Digital test of ZigBee transmitters: Validation in industrial test environment. DATE (2021)
T. Vayssade, Florence Azaïs, Laurent Latorre, François Lefevre
EVM measurement of RF ZigBee transceivers using standard digital ATE. DFT (2020)
Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzèrho, Francois Lefevre, I. Gorenflot
Implementing indirect test of RF circuits without compromising test quality: a practical case study. LATS (2020)
Florence Azaïs, Serge Bernard, Mariane Comte, Bastien Deveautour, Sophie Dupuis, Hassan El Badawi, Marie-Lise Flottes, Patrick Girard, Vincent Kerzèrho, Laurent Latorre, François Lefèvre, Bruno Rouzeyre, Emanuele Valea, T. Vayssade, Arnaud Virazel
Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs. IOLTS (2020)
Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre
Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits. J. Electron. Test. 36 (2) (2020)
Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre
Use of ensemble methods for indirect test of RF circuits: can it bring benefits? LATS (2019)
Hassan El Badawi, Mariane Comte, Florence Azaïs, Vincent Kerzèrho, Serge Bernard, François Lefevre
Which metrics to use for RF indirect test strategy? SMACD (2019)
Amit Karel, Florence Azaïs, Mariane Comte, Jean Marc Gallière, Michel Renovell
Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI Technologies. J. Electron. Test. 35 (1) (2019)
T. Vayssade, Florence Azaïs, Laurent Latorre, Francois Lefevre
Power Measurement and Spectral Test of ZigBee Transmitters from 1-bit Under-sampled Acquisition. ETS (2019)
Amit Karel, Florence Azaïs, Mariane Comte, Jean Marc Gallière, Michel Renovell
Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologies. LATS (2018)
T. Vayssade, Florence Azaïs, Laurent Latorre, Francois Lefevre
Low-cost functional test of a 2.4 GHz OQPSK transmitter using standard digital ATE. IOLTS (2018)
Stephane David-Grignot, Achraf Lamlih, Mohamed Moez Belhaj, Vincent Kerzerho, Florence Azaïs, Fabien Soulier, Philippe Freitas, Tristan Rouyer, Sylvain Bonhommeau, Serge Bernard
On-chip Generation of Sine-wave Summing Digital Signals: an Analytic Study Considering Implementation Constraints. J. Electron. Test. 34 (3) (2018)
Amit Karel, Florence Azaïs, Mariane Comte, Jean Marc Gallière, Michel Renovell, Keshav Singh
Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology. ISVLSI (2017)
Amit Karel, Florence Azaïs, Mariane Comte, Jean Marc Gallière, Michel Renovell, Keshav Singh
Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions. ETS (2017)
Amit Karel, Mariane Comte, Jean Marc Gallière, Florence Azaïs, Michel Renovell
Resistive Bridging Defect Detection in Bulk, FDSOI and FinFET Technologies. J. Electron. Test. 33 (4) (2017)
Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre
Digital Embedded Test Instrument for On-Chip Phase Noise Testing of Analog/RF Integrated Circuits. J. Circuits Syst. Comput. 25 (3) (2016)
Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre
SSB Phase Noise Evaluation of Analog/IF Signals on Standard Digital ATE. J. Electron. Test. 32 (1) (2016)
Amit Karel, Mariane Comte, Jean Marc Gallière, Florence Azaïs, Michel Renovell
Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defect. LATS (2016)
Amit Karel, Mariane Comte, Jean Marc Gallière, Florence Azaïs, Michel Renovell
Impact of VT and Body-Biasing on Resistive Short Detection in 28nm UTBB FDSOI - LVT and RVT Configurations. ISVLSI (2016)
Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell
A Framework for Efficient Implementation of Analog/RF Alternate Test with Model Redundancy. ISVLSI (2015)
Vincent Kerzerho, Ludovic Guillaume-Sage, Florence Azaïs, Mariane Comte, Michel Renovell, Serge Bernard
Toward Adaptation of ADCs to Operating Conditions through On-chip Correction. ISVLSI (2015)
Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre
A digital technique for the evaluation of SSB phase noise of analog/RF signals. LATS (2015)
Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell
Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategies. Microelectron. J. 46 (11) (2015)
Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre
A new technique for low-cost phase noise production testing from 1-bit signal acquisition. ETS (2015)
Manuel J. Barragan, Gildas Léger, Florence Azaïs, Ronald D. Blanton, Adit D. Singh, Stephen Sunter
Special session: Hot topics: Statistical test methods. VTS (2015)
Florence Azaïs
Analog test: Why still "à la mode" after more than 25 years of research? ETS (2015)
Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre
Phase Noise Testing of Analog/IF Signals Using Digital ATE: A New Post-Processing Algorithm for Extended Measurement Range. J. Electron. Test. 31 (5-6) (2015)
Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre
Embedded Test Instrument for On-Chip Phase Noise Evaluation of Analog/IF Signals. DDECS (2015)
Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell
New implementions of predictive alternate analog/RF test with augmented model redundancy. DATE (2014)
Ahmed Amine Rekik, Florence Azaïs, Frédérick Mailly, Pascal Nouet
Study of Low-Cost Electrical Test Strategies for Post-Silicon Yield Improvement of MEMS Convective Accelerometers. J. Electron. Test. 30 (1) (2014)
Syhem Larguech, Florence Azaïs, Serge Bernard, Vincent Kerzerho, Mariane Comte, Michel Renovell
Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing. LATW (2014)
Martin Andraud, Anthony Deluthault, Mouhamadou Dieng, Florence Azaïs, Serge Bernard, Philippe Cauvet, Mariane Comte, Thibault Kervaon, Vincent Kerzerho, Salvador Mir, Paul-Henri Pugliesi-Conti, Michel Renovell, Fabien Soulier, Emmanuel Simeu, Haralampos-G. D. Stratigopoulos
Solutions for the self-adaptation of communicating systems in operation. IOLTS (2014)
Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre
Low-cost phase noise testing of complex RF ICs using standard digital ATE. ITC (2014)
Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell
Enhancing confidence in indirect analog/RF testing against the lack of correlation between regular parameters and indirect measurements. Microelectron. J. 45 (3) (2014)
Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre
Phase noise measurement on IF analog signals using standard digital ATE resources. NEWCAS (2014)
Jean Marc Gallière, Florence Azaïs, Mariane Comte, Michel Renovell
Testing for gate oxide short defects using the detectability interval paradigm. it Inf. Technol. 56 (4) (2014)
Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Olivier Potin, Michel Renovell
Implementing model redundancy in predictive alternate test to improve test confidence. ETS (2013)
Mouhamadou Dieng, Mariane Comte, Serge Bernard, Vincent Kerzerho, Florence Azaïs, Michel Renovell, Thibault Kervaon, Paul-Henri Pugliesi-Conti
Accurate and efficient analytical electrical model of antenna for NFC applications. NEWCAS (2013)
Vincent Kerzerho, Serge Bernard, Florence Azaïs, Mariane Comte, Olivier Potin, Chuan Shan, G. Bontorin, Michel Renovell
A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC. Microelectron. J. 44 (9) (2013)
Marina Aparicio, Mariane Comte, Florence Azaïs, Michel Renovell, Jie Jiang, Ilia Polian, Bernd Becker
Pre-characterization procedure for a mixed mode simulation of IR-drop induced delays. LATW (2013)
Jie Jiang, Marina Aparicio, Mariane Comte, Florence Azaïs, Michel Renovell, Ilia Polian
MIRID: Mixed-Mode IR-Drop Induced Delay Simulator. Asian Test Symposium (2013)
Florence Azaïs, Laurent Latorre
Low-cost SNR estimation of analog signals using standard digital automated test equipment (ATE). NEWCAS (2012)
Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Olivier Potin, Michel Renovell
Making predictive analog/RF alternate test strategy independent of training set size. ITC (2012)
Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Michel Renovell, Vincent Kerzerho, Olivier Potin, Christophe Kelma
Smart selection of indirect parameters for DC-based alternate RF IC testing. VTS (2012)
Ahmed Amine Rekik, Florence Azaïs, Frédérick Mailly, Pascal Nouet
Design-for-manufacturability of MEMS convective accelerometers through adaptive electrical calibration strategy. LATW (2012)
Nicolas Pous, Florence Azaïs, Laurent Latorre, Jochen Rivoir
A Level-Crossing Approach for the Analysis of RF Modulated Signals Using Only Digital Test Resources. J. Electron. Test. 27 (3) (2011)
Ahmed Amine Rekik, Florence Azaïs, Norbert Dumas, Frédérick Mailly, Pascal Nouet
A Behavioral Model of MEMS Convective Accelerometers for the Evaluation of Design and Calibration Strategies at System Level. J. Electron. Test. 27 (3) (2011)
Ahmed Amine Rekik, Florence Azaïs, Norbert Dumas, Frédérick Mailly, Pascal Nouet
An electrical test method for MEMS convective accelerometers: Development and evaluation. DATE (2011)
Ahmed Amine Rekik, Florence Azaïs, Norbert Dumas, Frédérick Mailly, Pascal Nouet
Test and calibration of MEMS convective accelerometers with a fully electrical setup. LATW (2011)
Vincent Kerzerho, Mariane Comte, Florence Azaïs, Philippe Cauvet, Serge Bernard, Michel Renovell
Digital Test Method for Embedded Converters with Unknown-Phase Harmonics. J. Electron. Test. 27 (3) (2011)
Nicolas Pous, Florence Azaïs, Laurent Latorre, Jochen Rivoir
On the use of standard digital ATE for the analysis of RF signals. ETS (2010)
Nicolas Pous, Florence Azaïs, Laurent Latorre, Pascal Nouet, Jochen Rivoir
Experiments on the analysis of phase/frequency-modulated RF signals using digital tester channels. LATW (2010)
Norbert Dumas, Florence Azaïs, Frédérick Mailly, Pascal Nouet
Study of an Electrical Setup for Capacitive MEMS Accelerometers Test and Calibration. J. Electron. Test. 26 (1) (2010)
Jean-Robert Manouvrier, Pascal Fonteneau, Charles-Alexandre Legrand, Pascal Nouet, Florence Azaïs
Characterization of the transient behavior of gated/STI diodes and their associated BJT in the CDM time domain. Microelectron. Reliab. 49 (12) (2009)
Florence Azaïs, Yves Bertrand, Michel Renovell
An analysis of the timing behavior of CMOS digital blocks under Simultaneous Switching Noise conditions. DDECS (2009)
Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell
A multi-converter DFT technique for complex SIP: Concepts and validation. ECCTD (2009)
Nicolas Pous, Florence Azaïs, Laurent Latorre, Pascal Nouet, Jochen Rivoir
Exploiting Zero-Crossing for the Analysis of FM Modulated Analog/RF Signals Using Digital ATE. Asian Test Symposium (2009)
Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Michel Renovell, Mariane Comte, Omar Chakib
ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator. VLSI Design 2008 (2008)
Norbert Dumas, Florence Azaïs, Frédérick Mailly, Andrew Richardson, Pascal Nouet
A novel method for test and calibration of capacitive accelerometers with a fully electrical setup. DDECS (2008)
Florence Azaïs, Laurent Larguier, Yves Bertrand, Michel Renovell
On the Detection of SSN-Induced Logic Errors through On-Chip Monitoring. IOLTS (2008)
Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell
Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC. IET Comput. Digit. Tech. 1 (3) (2007)
Florence Azaïs, Laurent Larguier, Michel Renovell
Impact of Simultaneous Switching Noise on the Static behavior of Digital CMOS Circuits. ATS (2007)
Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell
"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. ETS (2007)
Christophe Entringer, Philippe Flatresse, Philippe Galy, Florence Azaïs, Pascal Nouet
Electro-thermal short pulsed simulation for SOI technology. Microelectron. Reliab. 46 (9-11) (2006)
Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell
"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. ETS (2006)
Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell
A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs. IEEE Des. Test Comput. 23 (3) (2006)
Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet
Electro-thermal Stimuli for MEMS Testing in FSBM Technology. J. Electron. Test. 22 (2) (2006)
Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell
Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications. J. Electron. Test. 21 (3) (2005)
Antonio Andrade Jr., Gustavo Vieira, Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell
Built-in self-test of global interconnects of field programmable analog arrays. Microelectron. J. 36 (12) (2005)
Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet
On-Chip Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field Sensor. VTS (2005)
Frédérick Mailly, Florence Azaïs, Norbert Dumas, Laurent Latorre, Pascal Nouet
Towards on-line testing of MEMS using electro-thermal excitation. ETS (2005)
Florence Azaïs, B. Caillard, S. Dournelle, P. Salomé, Pascal Nouet
A new multi-finger SCR-based structure for efficient on-chip ESD protection. Microelectron. Reliab. 45 (2) (2005)
Jean Marc Gallière, Michel Renovell, Florence Azaïs, Yves Bertrand
Delay Testing Viability of Gate Oxide Short Defects. J. Comput. Sci. Technol. 20 (2) (2005)
Gustavo Pereira, Antonio Andrade Jr., Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell
Testing the Interconnect Networks and I/O Resources of Field Programmable Analog Arrays. VTS (2005)
Florence Azaïs, Marcelo Lubaszewski, Pascal Nouet, Michel Renovell
A Strategy for Optimal Test Point Insertion in Analog Cascaded Filters. J. Electron. Test. 21 (1) (2005)
Tiago R. Balen, Antonio Q. Andrade, Florence Azaïs, Marcelo Lubaszewski, Michel Renovell
Applying the Oscillation Test Strategy to FPAA's Configurable Analog Blocks. J. Electron. Test. 21 (2) (2005)
Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Marcelo Lubaszewski, Michel Renovell
An Approach to the Built-In Self-Test of Field Programmable Analog Arrays. VTS (2004)
D. Martin, Romain Desplats, Gérald Haller, Pascal Nouet, Florence Azaïs
Automated Diagnosis and Probing Flow for Fast Fault Localization in IC. Microelectron. Reliab. 44 (9-11) (2004)
Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell
Efficiency of Spectral-Based ADC Test Flows to Detect Static Errors. J. Electron. Test. 20 (3) (2004)
Antonio Zenteno, Víctor H. Champac, Michel Renovell, Florence Azaïs
Analysis and Attenuation Proposal in Ground Bounce. Asian Test Symposium (2004)
Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell
Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure. J. Electron. Test. 20 (4) (2004)
Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Michel Renovell, Marcelo Lubaszewski
Testing the Configurable Analog Blocks of Field Programmable Analog Arrays. ITC (2004)
Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet
Electrically-induced thermal stimuli for MEMS testing. ETS (2004)
Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell
A New Methodology For ADC Test Flow Optimization. ITC (2003)
Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell
On-Chip Generation of Ramp and Triangle-Wave Stimuli for ADC BIST. J. Electron. Test. 19 (4) (2003)
Uros Kac, Franc Novak, Florence Azaïs, Pascal Nouet, Michel Renovell
Extending IEEE Std. 1149.4 Analog Boundary Modules to Enhance Mixed-Signal Test. IEEE Des. Test Comput. 20 (2) (2003)
Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell
A-to-D converters static error detection from dynamic parameter measurement. Microelectron. J. 34 (10) (2003)
Michel Renovell, Jean Marc Gallière, Florence Azaïs, Yves Bertrand
Delay Testing of MOS Transistor with Gate Oxide Short. Asian Test Symposium (2003)
Michel Renovell, Jean Marc Gallière, Florence Azaïs, Yves Bertrand
Modeling the Random Parameters Effects in a Non-Split Model of Gate Oxide Short. J. Electron. Test. 19 (4) (2003)
Florence Azaïs, Yves Bertrand, Michel Renovell, André Ivanov, Sassan Tabatabaei
An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs. IEEE Des. Test Comput. 20 (1) (2003)
Michel Renovell, Jean Marc Gallière, Florence Azaïs, Yves Bertrand
Modeling gate oxide short defects in CMOS minimum transistors. ETW (2002)

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Publication Activity (10 Years)

Top Topics

Top Venues

Florence Azaïs