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A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC.

Vincent KerzerhoSerge BernardFlorence AzaïsMariane ComteOlivier PotinChuan ShanG. BontorinMichel Renovell
Published in: Microelectron. J. (2013)
Keyphrases
  • efficient implementation
  • neural network
  • database
  • real time
  • data sets
  • learning algorithm
  • information systems
  • case study
  • gray scale
  • segmentation method
  • mean shift
  • error detection