Vincent Kerzerho

Publication Activity (10 Years)

Years Active: 2006-2024
Publications (10 Years): 15

Top Topics

Selection Strategies

Ensemble Methods

Bootstrap Sampling

Loading Conditions

Top Venues

J. Electron. Test.

Microelectron. J.

Publications

Stéphane Pitou, Florence Azaïs, Serge Bernard, Tristan Rouyer, Fabien Soulier, Vincent Kerzerho
Low-Resource Fully-Digital BPSK Demodulation Technique for Intra-Body Wireless Sensor Networks. I2MTC (2024)
Stéphane Pitou, Tristan Rouyer, Sylvain Bonhommeau, Serge Bernard, Fabien Soulier, Vincent Kerzerho
First Step Towards a Fully-Miniaturized Intra-body Communication Transceiver Based on Galvanic Coupling. FICC (1) (2023)
Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre
On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits. J. Electron. Test. 39 (2) (2023)
Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre
Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit. J. Electron. Test. 37 (2) (2021)
Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre
Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits. J. Electron. Test. 36 (2) (2020)
Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre
Use of ensemble methods for indirect test of RF circuits: can it bring benefits? LATS (2019)
Fabien Soulier, Achraf Lamlih, Vincent Kerzerho, Serge Bernard, Tristan Rouyer
Very Low Resource Digital Implementation of Bioimpedance Analysis. Sensors 19 (15) (2019)
Achraf Lamlih, Philippe Freitas, Mohamed Moez Belhaj, Jérémie Salles, Vincent Kerzerho, Fabien Soulier, Serge Bernard, Tristan Rouyer, Sylvain Bonhommeau
A Hybrid Bioimpedance Spectroscopy Architecture for a Wide Frequency Exploration of Tissue Electrical Properties. VLSI-SoC (2018)
Fabien Soulier, Achraf Lamlih, Vincent Kerzerho, Serge Bernard
A Multitone Analysis for Bioimpedance Spectroscopy using Minimal Digital Ressource. ICST (2018)
Stephane David-Grignot, Achraf Lamlih, Mohamed Moez Belhaj, Vincent Kerzerho, Florence Azaïs, Fabien Soulier, Philippe Freitas, Tristan Rouyer, Sylvain Bonhommeau, Serge Bernard
On-chip Generation of Sine-wave Summing Digital Signals: an Analytic Study Considering Implementation Constraints. J. Electron. Test. 34 (3) (2018)
Mohan Julien, Serge Bernard, Fabien Soulier, Vincent Kerzerho, Guy Cathébras
Improvement of Active-Input Current Mirrors Using Adaptive Biasing Technique. DCIS (2018)
Anthony Deluthault, Vincent Kerzerho, Serge Bernard, Fabien Soulier, Philippe Cauvet
New Calibration Technique of Contact-less Resonant Biosensor. J. Electron. Test. 33 (3) (2017)
Mohan Julien, Serge Bernard, Fabien Soulier, Vincent Kerzerho, Guy Cathébras
Formal analysis of high-performance stabilized active-input current mirror. ISCAS (2017)
Mohan Julien, Serge Bernard, Fabien Soulier, Vincent Kerzerho, Guy Cathébras
Formal analysis of bandwidth enhancement for high-performance active-input current mirror. DTIS (2017)
Anthony Deluthault, Luc Mezenge, Philippe Cauvet, Vincent Kerzerho, Fabien Soulier, Serge Bernard
Efficient Objective Metric Tool for Medical Electrical Device Development: Eye Phantom for Glaucoma Diagnosis Device. J. Sensors 2017 (2017)
Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell
A Framework for Efficient Implementation of Analog/RF Alternate Test with Model Redundancy. ISVLSI (2015)
Vincent Kerzerho, Ludovic Guillaume-Sage, Florence Azaïs, Mariane Comte, Michel Renovell, Serge Bernard
Toward Adaptation of ADCs to Operating Conditions through On-chip Correction. ISVLSI (2015)
Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell
Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategies. Microelectron. J. 46 (11) (2015)
Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell
New implementions of predictive alternate analog/RF test with augmented model redundancy. DATE (2014)
Syhem Larguech, Florence Azaïs, Serge Bernard, Vincent Kerzerho, Mariane Comte, Michel Renovell
Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing. LATW (2014)
Martin Andraud, Anthony Deluthault, Mouhamadou Dieng, Florence Azaïs, Serge Bernard, Philippe Cauvet, Mariane Comte, Thibault Kervaon, Vincent Kerzerho, Salvador Mir, Paul-Henri Pugliesi-Conti, Michel Renovell, Fabien Soulier, Emmanuel Simeu, Haralampos-G. D. Stratigopoulos
Solutions for the self-adaptation of communicating systems in operation. IOLTS (2014)
Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell
Enhancing confidence in indirect analog/RF testing against the lack of correlation between regular parameters and indirect measurements. Microelectron. J. 45 (3) (2014)
Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Olivier Potin, Michel Renovell
Implementing model redundancy in predictive alternate test to improve test confidence. ETS (2013)
Mouhamadou Dieng, Mariane Comte, Serge Bernard, Vincent Kerzerho, Florence Azaïs, Michel Renovell, Thibault Kervaon, Paul-Henri Pugliesi-Conti
Accurate and efficient analytical electrical model of antenna for NFC applications. NEWCAS (2013)
Vincent Kerzerho, Serge Bernard, Florence Azaïs, Mariane Comte, Olivier Potin, Chuan Shan, G. Bontorin, Michel Renovell
A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC. Microelectron. J. 44 (9) (2013)
Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Olivier Potin, Michel Renovell
Making predictive analog/RF alternate test strategy independent of training set size. ITC (2012)
Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Michel Renovell, Vincent Kerzerho, Olivier Potin, Christophe Kelma
Smart selection of indirect parameters for DC-based alternate RF IC testing. VTS (2012)
Vincent Kerzerho, Vincent Fresnaud, Dominique Dallet, Serge Bernard, Lilian Bossuet
Fast Digital Post-Processing Technique for Integral Nonlinearity Correction of Analog-to-Digital Converters: Validation on a 12-Bit Folding-and-Interpolating Analog-to-Digital Converter. IEEE Trans. Instrum. Meas. 60 (3) (2011)
Vincent Kerzerho, Mariane Comte, Florence Azaïs, Philippe Cauvet, Serge Bernard, Michel Renovell
Digital Test Method for Embedded Converters with Unknown-Phase Harmonics. J. Electron. Test. 27 (3) (2011)
Xiaoqin Sheng, Vincent Kerzerho, Hans G. Kerkhoff
Predicting dynamic specifications of ADCs with a low-quality digital input signal. ETS (2010)
Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell
A multi-converter DFT technique for complex SIP: Concepts and validation. ECCTD (2009)
Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Michel Renovell, Mariane Comte, Omar Chakib
ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator. VLSI Design 2008 (2008)
Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell
Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC. IET Comput. Digit. Tech. 1 (3) (2007)
Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell
"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. ETS (2007)
Vincent Kerzerho, Serge Bernard, Philippe Cauvet, Jean-Marie Janik
A First Step for an INL Spectral-Based BIST: The Memory Optimization. J. Electron. Test. 22 (4-6) (2006)
Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell
"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. ETS (2006)
Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell
A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs. IEEE Des. Test Comput. 23 (3) (2006)