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Francois Lefevre
Publication Activity (10 Years)
Years Active: 2014-2023
Publications (10 Years): 13
Top Topics
Ensemble Methods
Radio Frequency
Circuit Design
Signal Acquisition
Top Venues
J. Electron. Test.
LATS
ETS
NEWCAS
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Publications
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Hassan El Badawi
,
Florence Azaïs
,
Serge Bernard
,
Mariane Comte
,
Vincent Kerzerho
,
Francois Lefevre
On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits.
J. Electron. Test.
39 (2) (2023)
Hassan El Badawi
,
Florence Azaïs
,
Serge Bernard
,
Mariane Comte
,
Vincent Kerzerho
,
Francois Lefevre
Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit.
J. Electron. Test.
37 (2) (2021)
Hassan El Badawi
,
Florence Azaïs
,
Serge Bernard
,
Mariane Comte
,
Vincent Kerzèrho
,
Francois Lefevre
,
I. Gorenflot
Implementing indirect test of RF circuits without compromising test quality: a practical case study.
LATS
(2020)
Hassan El Badawi
,
Florence Azaïs
,
Serge Bernard
,
Mariane Comte
,
Vincent Kerzerho
,
Francois Lefevre
Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits.
J. Electron. Test.
36 (2) (2020)
Hassan El Badawi
,
Florence Azaïs
,
Serge Bernard
,
Mariane Comte
,
Vincent Kerzerho
,
Francois Lefevre
Use of ensemble methods for indirect test of RF circuits: can it bring benefits?
LATS
(2019)
T. Vayssade
,
Florence Azaïs
,
Laurent Latorre
,
Francois Lefevre
Power Measurement and Spectral Test of ZigBee Transmitters from 1-bit Under-sampled Acquisition.
ETS
(2019)
T. Vayssade
,
Florence Azaïs
,
Laurent Latorre
,
Francois Lefevre
Low-cost functional test of a 2.4 GHz OQPSK transmitter using standard digital ATE.
IOLTS
(2018)
Florence Azaïs
,
Stephane David-Grignot
,
Laurent Latorre
,
Francois Lefevre
Digital Embedded Test Instrument for On-Chip Phase Noise Testing of Analog/RF Integrated Circuits.
J. Circuits Syst. Comput.
25 (3) (2016)
Florence Azaïs
,
Stephane David-Grignot
,
Laurent Latorre
,
Francois Lefevre
SSB Phase Noise Evaluation of Analog/IF Signals on Standard Digital ATE.
J. Electron. Test.
32 (1) (2016)
Florence Azaïs
,
Stephane David-Grignot
,
Laurent Latorre
,
Francois Lefevre
A digital technique for the evaluation of SSB phase noise of analog/RF signals.
LATS
(2015)
Stephane David-Grignot
,
Florence Azaïs
,
Laurent Latorre
,
Francois Lefevre
A new technique for low-cost phase noise production testing from 1-bit signal acquisition.
ETS
(2015)
Stephane David-Grignot
,
Florence Azaïs
,
Laurent Latorre
,
Francois Lefevre
Phase Noise Testing of Analog/IF Signals Using Digital ATE: A New Post-Processing Algorithm for Extended Measurement Range.
J. Electron. Test.
31 (5-6) (2015)
Florence Azaïs
,
Stephane David-Grignot
,
Laurent Latorre
,
Francois Lefevre
Embedded Test Instrument for On-Chip Phase Noise Evaluation of Analog/IF Signals.
DDECS
(2015)
Stephane David-Grignot
,
Florence Azaïs
,
Laurent Latorre
,
Francois Lefevre
Low-cost phase noise testing of complex RF ICs using standard digital ATE.
ITC
(2014)
Stephane David-Grignot
,
Florence Azaïs
,
Laurent Latorre
,
Francois Lefevre
Phase noise measurement on IF analog signals using standard digital ATE resources.
NEWCAS
(2014)