Laurent Latorre

Publication Activity (10 Years)

Years Active: 1999-2024
Publications (10 Years): 16

Top Topics

Special Session

Radio Frequency

Signal Acquisition

Undergraduate Students

Top Venues

J. Electron. Test.

Publications

K. Tahraoui, T. Vayssade, François Lefèvre, Laurent Latorre, Florence Azaïs
Digital generation of single tone FM/PM test stimuli: a theoretical analysis. LATS (2024)
Thibault Vayssade, Florence Azaïs, Laurent Latorre, François Lefèvre
Low-cost digital solution for production test of ZigBee transmitters Special Session "AMS-RF testing". LATS (2023)
Jonathan Miquel, Laurent Latorre, Simon Chamaillé-Jammes
Addressing Power Issues in Biologging: An Audio/Inertial Recorder Case Study. Sensors 22 (21) (2022)
Thibault Vayssade, Mouhamad Chehaitly, Florence Azaïs, Laurent Latorre, François Lefèvre
Exploration of a digital-based solution for the generation of 2.4GHz OQPSK test stimuli. ETS (2021)
T. Vayssade, Florence Azaïs, Laurent Latorre, François Lefèvre
Low-Cost EVM Measurement of ZigBee Transmitters From 1-bit Undersampled Acquisition. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40 (11) (2021)
Thibault Vayssade, Florence Azaïs, Laurent Latorre, François Lefèvre
Digital test of ZigBee transmitters: Validation in industrial test environment. DATE (2021)
T. Vayssade, Florence Azaïs, Laurent Latorre, François Lefevre
EVM measurement of RF ZigBee transceivers using standard digital ATE. DFT (2020)
Florence Azaïs, Serge Bernard, Mariane Comte, Bastien Deveautour, Sophie Dupuis, Hassan El Badawi, Marie-Lise Flottes, Patrick Girard, Vincent Kerzèrho, Laurent Latorre, François Lefèvre, Bruno Rouzeyre, Emanuele Valea, T. Vayssade, Arnaud Virazel
Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs. IOLTS (2020)
T. Vayssade, Florence Azaïs, Laurent Latorre, Francois Lefevre
Power Measurement and Spectral Test of ZigBee Transmitters from 1-bit Under-sampled Acquisition. ETS (2019)
T. Vayssade, Florence Azaïs, Laurent Latorre, Francois Lefevre
Low-cost functional test of a 2.4 GHz OQPSK transmitter using standard digital ATE. IOLTS (2018)
Beatrice Pradarelli, Pascal Nouet, Laurent Latorre
Combo of innovative educational approaches to teach industrial test to undergraduate students. EDUCON (2017)
Beatrice Pradarelli, Pascal Nouet, Laurent Latorre
Industrial test project oriented education. EDUCON (2016)
Beatrice Pradarelli, Pascal Nouet, Laurent Latorre
Problem-Based Learning Approach to Teach Printed Circuit Boards Test. ICL (1) (2016)
Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre
Digital Embedded Test Instrument for On-Chip Phase Noise Testing of Analog/RF Integrated Circuits. J. Circuits Syst. Comput. 25 (3) (2016)
Beatrice Pradarelli, Pascal Nouet, Laurent Latorre
Per peers learning educational approach to teach industrial test to undergraduate students. EWME (2016)
Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre
SSB Phase Noise Evaluation of Analog/IF Signals on Standard Digital ATE. J. Electron. Test. 32 (1) (2016)
Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre
A digital technique for the evaluation of SSB phase noise of analog/RF signals. LATS (2015)
Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre
A new technique for low-cost phase noise production testing from 1-bit signal acquisition. ETS (2015)
Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre
Phase Noise Testing of Analog/IF Signals Using Digital ATE: A New Post-Processing Algorithm for Extended Measurement Range. J. Electron. Test. 31 (5-6) (2015)
Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre
Embedded Test Instrument for On-Chip Phase Noise Evaluation of Analog/IF Signals. DDECS (2015)
Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre
Low-cost phase noise testing of complex RF ICs using standard digital ATE. ITC (2014)
Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre
Phase noise measurement on IF analog signals using standard digital ATE resources. NEWCAS (2014)
Florence Azaïs, Laurent Latorre
Low-cost SNR estimation of analog signals using standard digital automated test equipment (ATE). NEWCAS (2012)
Souha Hacine, Frédérick Mailly, Laurent Latorre, Pascal Nouet
Study of a high-resolution and low-power CMOS temperature sensor. NEWCAS (2012)
Pierre-Francois Desrumaux, Yoan Dupret, Jens Tingleff, Sean Minehane, Mark Redford, Laurent Latorre, Pascal Nouet
An efficient control variates method for yield estimation of analog circuits based on a local model. ICCAD (2012)
Nicolas Pous, Florence Azaïs, Laurent Latorre, Jochen Rivoir
A Level-Crossing Approach for the Analysis of RF Modulated Signals Using Only Digital Test Resources. J. Electron. Test. 27 (3) (2011)
Nicolas Pous, Florence Azaïs, Laurent Latorre, Jochen Rivoir
On the use of standard digital ATE for the analysis of RF signals. ETS (2010)
Nicolas Pous, Florence Azaïs, Laurent Latorre, Pascal Nouet, Jochen Rivoir
Experiments on the analysis of phase/frequency-modulated RF signals using digital tester channels. LATW (2010)
El Mehdi Boujamaa, Boris Alandry, Souha Hacine, Laurent Latorre, Frédérick Mailly, Pascal Nouet
A low power interface circuit for resistive sensors with digital offset compensation. ISCAS (2010)
Laurent Latorre, Beatrice Pradarelli, Pascal Nouet
Integrated Circuits Testing: Remote Access to Test Equipment for Labs and Engineering. Int. J. Online Eng. 5 (S1) (2009)
Nicolas Pous, Florence Azaïs, Laurent Latorre, Pascal Nouet, Jochen Rivoir
Exploiting Zero-Crossing for the Analysis of FM Modulated Analog/RF Signals Using Digital ATE. Asian Test Symposium (2009)
Beatrice Pradarelli, Laurent Latorre, Marie-Lise Flottes, Yves Bertrand, Pascal Nouet
Remote Labs for Industrial IC Testing. IEEE Trans. Learn. Technol. 2 (4) (2009)
Boris Alandry, Norbert Dumas, Laurent Latorre, Frédérick Mailly, Pascal Nouet
A CMOS Multi-sensor System for 3D Orientation Determination. ISVLSI (2008)
Olivier Leman, Frédérick Mailly, Laurent Latorre, Pascal Nouet
Study of First-Order Thermal Sigma-Delta Architecture for Convective Accelerometers CoRR (2008)
Jean Marc Gallière, Philippe Papet, Laurent Latorre
A 2-D VHDL-AMS Model for Disk-Shape Piezoelectric Transducers. BMAS (2008)
Olivier Leman, Laurent Latorre, Frédérick Mailly, Pascal Nouet
A Closed-Loop Architecture with Digital Output for Convective Accelerometers. ISVLSI (2008)
El Mehdi Boujamaa, Yannick Soulie, Frédérick Mailly, Laurent Latorre, Pascal Nouet
Rejection of Power Supply Noise in Wheatstone Bridges : Application to Piezoresistive MEMS CoRR (2008)
Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet
Electro-thermal Stimuli for MEMS Testing in FSBM Technology. J. Electron. Test. 22 (2) (2006)
Laurent Latorre, Yves Bertrand, Michel Robert, Marie-Lise Flottes
Test Engineering Education in Europe - The CRTC experience through the EuNICE-Test project. EDUTECH (2005)
Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet
On-Chip Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field Sensor. VTS (2005)
Frédérick Mailly, Florence Azaïs, Norbert Dumas, Laurent Latorre, Pascal Nouet
Towards on-line testing of MEMS using electro-thermal excitation. ETS (2005)
Laurent Latorre, Vincent Beroulle, Pascal Nouet
Design of CMOS MEMS based on mechanical resonators using a RF simulation approach. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23 (6) (2004)
Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet
Electrically-induced thermal stimuli for MEMS testing. ETS (2004)
Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet
On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanical Systems. DATE (2002)
Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet
Evaluation of the Oscillation-based Test Methodology for Micro-Electro-Mechanical Systems. VTS (2002)
Yves Bertrand, Marie-Lise Flottes, Florence Azaïs, Serge Bernard, Laurent Latorre, Regis Lorival
European Network for Test Education. DELTA (2002)
M. Dardalhon, Vincent Beroulle, Laurent Latorre, Pascal Nouet, Guy Perez, Jean Marc Nicot, Coumar Oudéa
Reliability analysis of CMOS MEMS structures obtained by Front Side Bulk Micromachining. Microelectron. Reliab. 42 (9-11) (2002)
Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet
Testing Resonant Micro-Electro-Mechanical Sensors using the Oscillation-based Test Methodology. LATW (2002)
Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet
Test and Testability of a Monolithic MEMS for Magnetic Field Sensing. J. Electron. Test. 17 (5) (2001)
Vincent Beroulle, Laurent Latorre, M. Dardalhon, Coumar Oudéa, Guy Perez, Francis Pressecq, Pascal Nouet
Impact of Technology Spreading on MEMS design Robustness. VLSI-SOC (2001)
Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet
Noise optimisation of a piezoresistive CMOS MEMS for magnetic field sensing. VLSI-SOC (2001)
Laurent Latorre, Yves Bertrand, P. Hazard, Francis Pressecq, Pascal Nouet
Design, Characterization & Modelling of a CMOS Magnetic Field Sensor. DATE (1999)