Digital Embedded Test Instrument for On-Chip Phase Noise Testing of Analog/RF Integrated Circuits.
Florence AzaïsStephane David-GrignotLaurent LatorreFrancois LefevrePublished in: J. Circuits Syst. Comput. (2016)
Keyphrases
- integrated circuit
- built in self test
- mixed signal
- circuit design
- metal oxide semiconductor
- analog vlsi
- cmos image sensor
- multi channel
- test cases
- printed circuit boards
- test generation
- low power
- software testing
- test suite
- statistical tests
- single chip
- electron beam
- test sequences
- integration testing
- test data
- high speed
- sigma delta
- printed circuit
- delta sigma
- data conversion
- embedded systems
- analog circuits
- cmos technology
- radio frequency
- design methodology
- signal processing
- analog to digital converter
- low cost
- control system