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Phase Noise Testing of Analog/IF Signals Using Digital ATE: A New Post-Processing Algorithm for Extended Measurement Range.

Stephane David-GrignotFlorence AzaïsLaurent LatorreFrancois Lefevre
Published in: J. Electron. Test. (2015)
Keyphrases
  • post processing
  • preprocessing
  • learning algorithm
  • computational complexity
  • median filtering
  • filtering method
  • tree structure
  • classification algorithm