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Embedded Test Instrument for On-Chip Phase Noise Evaluation of Analog/IF Signals.
Florence Azaïs
Stephane David-Grignot
Laurent Latorre
Francois Lefevre
Published in:
DDECS (2015)
Keyphrases
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analog vlsi
signal processing
low cost
circuit design
evaluation method
neural network
high speed
evaluation criteria
statistical significance
evolvable hardware
frequency modulation
real time
test cases
frequency domain
vlsi implementation
vlsi architecture