Mariane Comte

Publication Activity (10 Years)

Years Active: 2002-2023
Publications (10 Years): 16

Top Topics

Ensemble Methods

Comparative Study

Efficient Implementation

Analytical Model

Top Venues

J. Electron. Test.

Microelectron. J.

Publications

Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre
On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits. J. Electron. Test. 39 (2) (2023)
Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzèrho, François Lefèvre
Exploring on-line RF performance monitoring based on the indirect test strategy. LATS (2021)
Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre
Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit. J. Electron. Test. 37 (2) (2021)
Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzèrho, Francois Lefevre, I. Gorenflot
Implementing indirect test of RF circuits without compromising test quality: a practical case study. LATS (2020)
Florence Azaïs, Serge Bernard, Mariane Comte, Bastien Deveautour, Sophie Dupuis, Hassan El Badawi, Marie-Lise Flottes, Patrick Girard, Vincent Kerzèrho, Laurent Latorre, François Lefèvre, Bruno Rouzeyre, Emanuele Valea, T. Vayssade, Arnaud Virazel
Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs. IOLTS (2020)
Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre
Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits. J. Electron. Test. 36 (2) (2020)
Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre
Use of ensemble methods for indirect test of RF circuits: can it bring benefits? LATS (2019)
Hassan El Badawi, Mariane Comte, Florence Azaïs, Vincent Kerzèrho, Serge Bernard, François Lefevre
Which metrics to use for RF indirect test strategy? SMACD (2019)
Amit Karel, Florence Azaïs, Mariane Comte, Jean Marc Gallière, Michel Renovell
Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI Technologies. J. Electron. Test. 35 (1) (2019)
Amit Karel, Florence Azaïs, Mariane Comte, Jean Marc Gallière, Michel Renovell
Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologies. LATS (2018)
Amit Karel, Florence Azaïs, Mariane Comte, Jean Marc Gallière, Michel Renovell, Keshav Singh
Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology. ISVLSI (2017)
Amit Karel, Florence Azaïs, Mariane Comte, Jean Marc Gallière, Michel Renovell, Keshav Singh
Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions. ETS (2017)
Amit Karel, Mariane Comte, Jean Marc Gallière, Florence Azaïs, Michel Renovell
Resistive Bridging Defect Detection in Bulk, FDSOI and FinFET Technologies. J. Electron. Test. 33 (4) (2017)
Amit Karel, Mariane Comte, Jean Marc Gallière, Florence Azaïs, Michel Renovell
Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defect. LATS (2016)
Aida Todri-Sanial, Saraju P. Mohanty, Mariane Comte, Marc Belleville
Guest Editorial Special Issue on Nanoelectronic Circuit and System Design Methods for the Mobile Computing Era. ACM J. Emerg. Technol. Comput. Syst. 13 (2) (2016)
Amit Karel, Mariane Comte, Jean Marc Gallière, Florence Azaïs, Michel Renovell
Impact of VT and Body-Biasing on Resistive Short Detection in 28nm UTBB FDSOI - LVT and RVT Configurations. ISVLSI (2016)
Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell
A Framework for Efficient Implementation of Analog/RF Alternate Test with Model Redundancy. ISVLSI (2015)
Vincent Kerzerho, Ludovic Guillaume-Sage, Florence Azaïs, Mariane Comte, Michel Renovell, Serge Bernard
Toward Adaptation of ADCs to Operating Conditions through On-chip Correction. ISVLSI (2015)
Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell
Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategies. Microelectron. J. 46 (11) (2015)
Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell
New implementions of predictive alternate analog/RF test with augmented model redundancy. DATE (2014)
Syhem Larguech, Florence Azaïs, Serge Bernard, Vincent Kerzerho, Mariane Comte, Michel Renovell
Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing. LATW (2014)
Martin Andraud, Anthony Deluthault, Mouhamadou Dieng, Florence Azaïs, Serge Bernard, Philippe Cauvet, Mariane Comte, Thibault Kervaon, Vincent Kerzerho, Salvador Mir, Paul-Henri Pugliesi-Conti, Michel Renovell, Fabien Soulier, Emmanuel Simeu, Haralampos-G. D. Stratigopoulos
Solutions for the self-adaptation of communicating systems in operation. IOLTS (2014)
Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell
Enhancing confidence in indirect analog/RF testing against the lack of correlation between regular parameters and indirect measurements. Microelectron. J. 45 (3) (2014)
Jean Marc Gallière, Florence Azaïs, Mariane Comte, Michel Renovell
Testing for gate oxide short defects using the detectability interval paradigm. it Inf. Technol. 56 (4) (2014)
Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Olivier Potin, Michel Renovell
Implementing model redundancy in predictive alternate test to improve test confidence. ETS (2013)
Mouhamadou Dieng, Mariane Comte, Serge Bernard, Vincent Kerzerho, Florence Azaïs, Michel Renovell, Thibault Kervaon, Paul-Henri Pugliesi-Conti
Accurate and efficient analytical electrical model of antenna for NFC applications. NEWCAS (2013)
Vincent Kerzerho, Serge Bernard, Florence Azaïs, Mariane Comte, Olivier Potin, Chuan Shan, G. Bontorin, Michel Renovell
A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC. Microelectron. J. 44 (9) (2013)
Marina Aparicio, Mariane Comte, Florence Azaïs, Michel Renovell, Jie Jiang, Ilia Polian, Bernd Becker
Pre-characterization procedure for a mixed mode simulation of IR-drop induced delays. LATW (2013)
Jie Jiang, Marina Aparicio, Mariane Comte, Florence Azaïs, Michel Renovell, Ilia Polian
MIRID: Mixed-Mode IR-Drop Induced Delay Simulator. Asian Test Symposium (2013)
Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Olivier Potin, Michel Renovell
Making predictive analog/RF alternate test strategy independent of training set size. ITC (2012)
Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Michel Renovell, Vincent Kerzerho, Olivier Potin, Christophe Kelma
Smart selection of indirect parameters for DC-based alternate RF IC testing. VTS (2012)
Vincent Kerzerho, Mariane Comte, Florence Azaïs, Philippe Cauvet, Serge Bernard, Michel Renovell
Digital Test Method for Embedded Converters with Unknown-Phase Harmonics. J. Electron. Test. 27 (3) (2011)
Nicolas Houarche, Mariane Comte, Michel Renovell, Alejandro Czutro, Piet Engelke, Ilia Polian, Bernd Becker
An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects. VTS (2009)
Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell
A multi-converter DFT technique for complex SIP: Concepts and validation. ECCTD (2009)
Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Michel Renovell, Mariane Comte, Omar Chakib
ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator. VLSI Design 2008 (2008)
Alejandro Czutro, Nicolas Houarche, Piet Engelke, Ilia Polian, Mariane Comte, Michel Renovell, Bernd Becker
A Simulator of Small-Delay Faults Caused by Resistive-Open Defects. ETS (2008)
Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell
Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC. IET Comput. Digit. Tech. 1 (3) (2007)
Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell
"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. ETS (2007)
Mariane Comte, Satoshi Ohtake, Hideo Fujiwara, Michel Renovell
Electrical Behavior of GOS Fault affected Domino Logic Cell. DELTA (2006)
Michel Renovell, Mariane Comte, Ilia Polian, Piet Engelke, Bernd Becker
A Specific ATPG technique for Resistive Open with Sequence Recursive Dependency. ATS (2006)
Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell
"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. ETS (2006)
Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell
A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs. IEEE Des. Test Comput. 23 (3) (2006)
Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell
Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications. J. Electron. Test. 21 (3) (2005)
Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell
Efficiency of Spectral-Based ADC Test Flows to Detect Static Errors. J. Electron. Test. 20 (3) (2004)
Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell
Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure. J. Electron. Test. 20 (4) (2004)
Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell
A New Methodology For ADC Test Flow Optimization. ITC (2003)
Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell
A-to-D converters static error detection from dynamic parameter measurement. Microelectron. J. 34 (10) (2003)
Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell, Marcelo Lubaszewski
Estimating Static Parameters of A-to-D Converters from Spectral Analysis. LATW (2002)