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Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC.

Vincent KerzerhoPhilippe CauvetSerge BernardFlorence AzaïsMariane ComteMichel Renovell
Published in: IET Comput. Digit. Tech. (2007)
Keyphrases
  • small number
  • embedded systems
  • optimal solution
  • probability distribution
  • solution exists
  • neural network
  • objective function
  • closed form
  • statistical significance