Sign in
Smart selection of indirect parameters for DC-based alternate RF IC testing.
Haithem Ayari
Florence Azaïs
Serge Bernard
Mariane Comte
Michel Renovell
Vincent Kerzerho
Olivier Potin
Christophe Kelma
Published in:
VTS (2012)
Keyphrases
</>
fine tuning
parameter selection
parameter space
parameter values
parameter estimation
maximum likelihood
case study
maximum likelihood estimation
computer vision
least squares
relevance feedback
sensitivity analysis
neural network
selection algorithm
parametric models
integrated circuit
parameter tuning
website