PARAMETRIC MODELS
Experts
- Étienne André
- Didier Lime
- Timothy F. Cootes
- Luc Van Gool
- Benjamin Friedlander
- Hans-Peter Seidel
- Johan Schoukens
- Peter Benner
- Michael I. Jordan
- Simon Baker
- Pieter Abbeel
- Iain A. Matthews
- Christopher J. Taylor
- Boris Lohmann
- Thomas Kailath
- Maja Pantic
- Rik Pintelon
- Georgios Tzimiropoulos
- Subal C. Kumbhakar
- Karl Rohr
- Simon K. Warfield
- Finale Doshi-Velez
- Petre Stoica
- Stefan Sperlich
- Chuang Shi
- Frank P. A. Coolen
- Pramod K. Varshney
- Yoshinobu Kajikawa
- Nicholas Ayache
- Alfred O. Hero III
- Xin Li
- Junichi Yamagishi
- Gerd Ascheid
- Eiji Oki
- Stefan Wörz
- Alice Caplier
- Michael Unser
- Jeff G. Schneider
- Victor Solo
Venues
- CoRR
- ICASSP
- Comput. Stat. Data Anal.
- Commun. Stat. Simul. Comput.
- IEEE Access
- Remote. Sens.
- J. Multivar. Anal.
- IEEE Trans. Signal Process.
- IGARSS
- Sensors
- Eur. J. Oper. Res.
- CDC
- ACC
- IEEE Trans. Geosci. Remote. Sens.
- Autom.
- CVPR
- ICIP
- INTERSPEECH
- Stat. Comput.
- EUSIPCO
- NeuroImage
- EMBC
- ICRA
- ISBI
- IEEE Trans. Pattern Anal. Mach. Intell.
- ECC
- IROS
- ICCV
- NeurIPS
- WSC
- Environ. Model. Softw.
- IEEE Trans. Instrum. Meas.
- Appl. Math. Comput.
- BMVC
- NIPS
- Comput. Chem. Eng.
- ICML
- IEEE Trans. Biomed. Eng.
- IEEE Trans. Image Process.
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