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Enhancing confidence in indirect analog/RF testing against the lack of correlation between regular parameters and indirect measurements.

Haithem AyariFlorence AzaïsSerge BernardMariane ComteVincent KerzerhoMichel Renovell
Published in: Microelectron. J. (2014)
Keyphrases
  • measured data
  • maximum likelihood
  • data sets
  • genetic algorithm
  • active learning
  • test data
  • sensitivity analysis
  • parameter space
  • parameter values
  • parameter settings
  • optical properties