Login / Signup

A-to-D converters static error detection from dynamic parameter measurement.

Florence AzaïsSerge BernardYves BertrandMariane ComteMichel Renovell
Published in: Microelectron. J. (2003)
Keyphrases
  • error detection
  • error correction
  • fault isolation
  • error recovery
  • error correcting
  • fault tolerance
  • artificial intelligence
  • parameter space
  • dynamic analysis
  • error resilient