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Amit Karel
ORCID
Publication Activity (10 Years)
Years Active: 2016-2019
Publications (10 Years): 7
Top Topics
St Century
Defect Detection
False Positives
Human Body
Top Venues
LATS
J. Electron. Test.
ISVLSI
ETS
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Publications
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Amit Karel
,
Florence Azaïs
,
Mariane Comte
,
Jean Marc Gallière
,
Michel Renovell
Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI Technologies.
J. Electron. Test.
35 (1) (2019)
Amit Karel
,
Florence Azaïs
,
Mariane Comte
,
Jean Marc Gallière
,
Michel Renovell
Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologies.
LATS
(2018)
Amit Karel
,
Florence Azaïs
,
Mariane Comte
,
Jean Marc Gallière
,
Michel Renovell
,
Keshav Singh
Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology.
ISVLSI
(2017)
Amit Karel
,
Florence Azaïs
,
Mariane Comte
,
Jean Marc Gallière
,
Michel Renovell
,
Keshav Singh
Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions.
ETS
(2017)
Amit Karel
,
Mariane Comte
,
Jean Marc Gallière
,
Florence Azaïs
,
Michel Renovell
Resistive Bridging Defect Detection in Bulk, FDSOI and FinFET Technologies.
J. Electron. Test.
33 (4) (2017)
Amit Karel
,
Mariane Comte
,
Jean Marc Gallière
,
Florence Azaïs
,
Michel Renovell
Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defect.
LATS
(2016)
Amit Karel
,
Mariane Comte
,
Jean Marc Gallière
,
Florence Azaïs
,
Michel Renovell
Impact of VT and Body-Biasing on Resistive Short Detection in 28nm UTBB FDSOI - LVT and RVT Configurations.
ISVLSI
(2016)