Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology.
Amit KarelFlorence AzaïsMariane ComteJean Marc GallièreMichel RenovellKeshav SinghPublished in: ISVLSI (2017)
Keyphrases
- data processing
- detection algorithm
- object detection
- automatic detection
- false alarms
- detection accuracy
- case study
- automated detection
- key technologies
- rapid development
- detection method
- detection rate
- cost effective
- defect classification
- real time
- weak signal
- false positives
- intrusion detection
- supply chain
- information systems
- genetic algorithm
- machine learning
- data mining
- real world
- neural network