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Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs.

Florence AzaïsSerge BernardMariane ComteBastien DeveautourSophie DupuisHassan El BadawiMarie-Lise FlottesPatrick GirardVincent KerzèrhoLaurent LatorreFrançois LefèvreBruno RouzeyreEmanuele ValeaT. VayssadeArnaud Virazel
Published in: IOLTS (2020)
Keyphrases
  • practical application
  • decision support
  • knowledge management
  • signal processing
  • knowledge based systems
  • information systems
  • e learning
  • embedded systems
  • key management
  • data conversion