PRACTICAL APPLICATION
Experts
- David N. Blank-Edelman
- Emiliano Schena
- Daniele Tosi
- Carlo Massaroni
- Orr Dunkelman
- Paola Saccomandi
- Pierre-Alain Fouque
- Thomas Schneider
- Shigeo Hirose
- Nathan Keller
- Ahmad-Reza Sadeghi
- Dengguo Feng
- Elaine Shi
- Madina Shaimerdenova
- Bin Wang
- Yu Sasaki
- Haibin Zhang
- Prasant Misra
- Jan Camenisch
- Ling Ren
- Emil Stefanov
- Adam Turoff
- Shivam Bhasin
- Man Ho Au
- Stefania Campopiano
- Sofiène Affes
- Daniela Lo Presti
- Bart Preneel
- Aliya Bekmurzayeva
- Lucjan Hanzlik
- Vern Paxson
- Yuliang Li
- Alexandra M. Newman
- Victor Shoup
- Xueguang Qiao
- Dawn Song
- Qiang Wang
- Fang Wang
- Michele Arturo Caponero
Venues
- CoRR
- Sensors
- IACR Cryptol. ePrint Arch.
- IEEE Access
- login Usenix Mag.
- IEEE Trans. Instrum. Meas.
- ICRA
- CCS
- IROS
- J. Robotics Mechatronics
- Remote. Sens.
- IEEE SENSORS
- IGARSS
- WSC
- AMIA
- IEEE Trans. Ind. Electron.
- ICC
- J. Sensors
- USENIX Security Symposium
- EMBC
- OFC
- I2MTC
- ACC
- GLOBECOM
- SAC
- IAS
- Commun. ACM
- ITC
- Softw. Pract. Exp.
- Autom.
- ACSAC
- BMC Medical Informatics Decis. Mak.
- IEEE Trans. Geosci. Remote. Sens.
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- ICASSP
- Expert Syst. Appl.
- CDC
- Technometrics
- Int. CMG Conference
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend