ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator.
Vincent KerzerhoPhilippe CauvetSerge BernardFlorence AzaïsMichel RenovellMariane ComteOmar ChakibPublished in: VLSI Design (2008)
Keyphrases
- low resolution
- high resolution
- super resolution
- low resolution images
- high quality
- high resolution images
- image patches
- interpolation algorithm
- lower resolution
- image super resolution
- depth map
- resolution enhancement
- high resolution video
- dense correspondences
- face images
- higher resolution
- super resolution reconstruction
- remote sensing
- super resolution algorithm
- low quality images
- image pairs
- image reconstruction
- face recognition
- low frame rate
- data sets