DENSE CORRESPONDENCES
Experts
- Shi Jin
- Longxiang Yang
- Meng Zhou
- Robert W. Heath Jr.
- Josef A. Nossek
- A. Lee Swindlehurst
- Yonina C. Eldar
- Amine Mezghani
- Jinseok Choi
- Chao-Kai Wen
- Yao Zhang
- Daijin Kim
- Haotong Cao
- Prune Truong
- Richa Singh
- Jeffrey Skolnick
- Luc Van Gool
- Mayank Vatsa
- Brian L. Evans
- Martin Danelljan
- Shiming Ge
- Ali Mollahosseini
- Shaogang Gong
- Degang Chen
- Shefali Srivastava
- Kyoobin Lee
- Chein-I Chang
- Tal Hassner
- Hyung-Soo Lee
- Christoph Studer
- Qian Liu
- Jiansheng Chen
- Kyoung-Sic Cho
- Mojtaba Soltanalian
- Nir Shlezinger
- Horst Bischof
- Mohammad H. Mahoor
- Derrick Wing Kwan Ng
- Randall L. Geiger
Venues
- CoRR
- IEEE Trans. Image Process.
- ICASSP
- CVPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Access
- Pattern Recognit. Lett.
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Trans. Wirel. Commun.
- IGARSS
- ICIP
- BMVC
- IEEE Trans. Veh. Technol.
- IEEE Signal Process. Lett.
- Comput. Graph. Forum
- Remote. Sens.
- VISAPP (1)
- IROS
- Int. J. Comput. Vis.
- WCSP
- AVSS
- ICCV
- ICDAR
- IEEE Wirel. Commun. Lett.
- Sensors
- Pattern Recognit.
- IEEE Commun. Lett.
- IEEE Trans. Instrum. Meas.
- EMBC
- VCIP
- IEEE Trans. Commun.
- APSIPA
- Image Vis. Comput.
- CIARP
- SIU
- Sci. China Inf. Sci.
- ICC
- J. Electronic Imaging
- Entropy
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