DENSE CORRESPONDENCES
Experts
- Shi Jin
- Longxiang Yang
- Meng Zhou
- Josef A. Nossek
- A. Lee Swindlehurst
- Robert W. Heath Jr.
- Yonina C. Eldar
- Yao Zhang
- Amine Mezghani
- Chao-Kai Wen
- Daijin Kim
- Jinseok Choi
- Luc Van Gool
- Prune Truong
- Martin Danelljan
- Brian L. Evans
- Mayank Vatsa
- Haotong Cao
- Jeffrey Skolnick
- Richa Singh
- Kang An
- Shruti Nagpal
- Kyoung-Sic Cho
- Shiming Ge
- Milan Sonka
- Jaewon Sung
- Shaogang Gong
- Kilian Roth
- Shengwei Zhao
- Arun C. S. Kumar
- Randall L. Geiger
- Zoltan Kato
- Samiru Gayan
- Ali Mollahosseini
- Jiansheng Chen
- Shefali Srivastava
- Hyung-Soo Lee
- Tao Liang
- Qian Liu
Venues
- CoRR
- IEEE Trans. Image Process.
- ICASSP
- CVPR
- IEEE Access
- IEEE Trans. Wirel. Commun.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit. Lett.
- IEEE Trans. Geosci. Remote. Sens.
- BMVC
- ICIP
- IGARSS
- Comput. Graph. Forum
- IEEE Trans. Veh. Technol.
- IEEE Signal Process. Lett.
- Remote. Sens.
- Int. J. Comput. Vis.
- VISAPP (1)
- IROS
- WCSP
- FG
- IEEE Commun. Lett.
- ICCV
- AVSS
- ICDAR
- IEEE Trans. Commun.
- IEEE Trans. Instrum. Meas.
- Sensors
- Pattern Recognit.
- EMBC
- VCIP
- IEEE Wirel. Commun. Lett.
- CVPR Workshops
- J. Electronic Imaging
- SIU
- IEEE Trans. Circuits Syst. Video Technol.
- SMC
- J. Comput. Chem.
- WCNC
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