Randall L. Geiger

Publication Activity (10 Years)

Years Active: 1993-2024
Publications (10 Years): 20

Top Venues

MWSCAS

ISCAS

IEEE Trans. Circuits Syst. I Regul. Pap.

IEEE Trans. Instrum. Meas.

Publications

Kwabena Oppong Banahene, Randall L. Geiger
Compact Temperature Sensor with Voltage-Ratio Current-Independent Output for Reference Independent Data Conversion. ISCAS (2024)
Bryce Gadogbe, Randall L. Geiger
A 15μW Low Cost CMOS Smart Temperature Sensor. MWSCAS (2023)
Bryce Gadogbe, Ruohang Yang, Kwabena Oppong Banahene, Pallavi Ebenezer, Randall L. Geiger, Degang Chen
Very Compact Temperature Sensor for Power/Thermal Management. MWSCAS (2023)
Daniel Adjei, Bryce Gadogbe, Degang Chen, Randall L. Geiger
A Resistorless Precision Curvature-Compensated Bandgap Voltage Reference Based on the VGO Extraction Technique. ISCAS (2023)
Ruohan Yang, Bryce Gadogbe, Randall L. Geiger, Degang Chen
A Compact and Accurate MOS-based Temperature Sensor for Thermal Management. MWSCAS (2023)
Daniel Adjei, Bryce Gadogbe, Degang Chen, Randall L. Geiger, Shravan K. Chaganti, Dhyey Desai, Jerry Doorenbos, Jim Todsen
Order-Compensated Bandgap References. MWSCAS (2023)
Bryce Gadogbe, Daniel Adjei, Kwabena Oppong Banahene, Randall L. Geiger, Degang Chen
Sub-ppm/°C High Performance Voltage Reference. ISCAS (2023)
Kwabena Oppong Banahene, Matthew R. Strong, Bryce Gadogbe, Degang Chen, Randall L. Geiger
Hardware Security Vulnerability in Analog Signal Chain Filters. ISCAS (2022)
Nanqi Liu, Randall L. Geiger, Degang Chen
Sub-ppm/°C Bandgap References With Natural Basis Expansion for Curvature Cancellation. IEEE Trans. Circuits Syst. I Regul. Pap. 68 (9) (2021)
Pallavi Sugantha Ebenezer, Vijayalakshmi Naganadhan, Degang Chen, Randall L. Geiger
Three-Junction Bandgap Circuit with Sub 1 ppm/°C Temperature Coefficient. MWSCAS (2020)
Chulhyun Park, Tao Chen, Kyoohyun Noh, Dadian Zhou, Suraj Prakash, Mohammadhossein Naderi Alizadeh, Aydin I. Karsilayan, Degang Chen, Randall L. Geiger, José Silva-Martínez
A 12-Bit 125-MS/s 2.5-Bit/Cycle SAR-Based Pipeline ADC Employing a Self-Biased Gain Boosting Amplifier. IEEE Trans. Circuits Syst. (11) (2020)
Tao Chen, Chulhyun Park, Shravan K. Chaganti, José Silva-Martínez, Randall L. Geiger, Degang Chen
An Ultrafast Multibit/Stage Pipelined ADC Testing and Calibration Method. IEEE Trans. Instrum. Meas. 69 (3) (2020)
Tao Chen, Chulhyun Park, Hao Meng, Dadian Zhou, José Silva-Martínez, Randall L. Geiger, Degang Chen
A Low-Cost On-Chip Built-In Self-Test Solution for ADC Linearity Test. IEEE Trans. Instrum. Meas. 69 (6) (2020)
Tyler Archer, Pallavi Ebenezer, Chin-Wen Chen, Randall L. Geiger
Nonlinear Device Conversion. MWSCAS (2019)
Pallavi Ebenezer, Tyler Archer, Degang Chen, Randall L. Geiger
A Precision Bandgap Voltage Reference Using Curvature Elimination Technique. MWSCAS (2019)
Tao Chen, Xiankun Jin, Randall L. Geiger, Degang Chen
USER-SMILE: Ultrafast Stimulus Error Removal and Segmented Model Identification of Linearity Errors for ADC Built-in Self-Test. IEEE Trans. Circuits Syst. I Regul. Pap. (7) (2018)
Hao Meng, Randall L. Geiger, Degang Chen
A High Constancy Rail-to-rail Level Shift Generator for SEIR-based BIST circuit for ADCs. ISCAS (2018)
Qianqian Wang, Degang Chen, Randall L. Geiger
Transparent side channel trigger mechanism on analog circuits with PAAST hardware Trojans. ISCAS (2018)
Qianqian Wang, Degang Chen, Randall L. Geiger
Technique for generating timing skew resistant time-interleaved signals. MWSCAS (2017)
Xiankun Jin, Tao Chen, Mayank Jain, Arun Kumar Barman, David Kramer, Doug Garrity, Randall L. Geiger, Degang Chen
An on-chip ADC BIST solution and the BIST enabled calibration scheme. ITC (2017)
Xu Zhang, Chongli Cai, Hao Meng, Siva Sudani, Randall L. Geiger, Degang Chen
A calibration technique for SAR analog-to-digital converter based on INL testing with quantization bits and redundant bit. ISCAS (2015)
Xing Cao, Qianqian Wang, Randall L. Geiger, Degang Chen
A hardware Trojan embedded in the Inverse Widlar reference generator. MWSCAS (2015)
Yen-Ting Wang, Chen Zhao, Degang Chen, Randall L. Geiger
Direct temperature to digital converters with low supply sensitivity for power/thermal management. ISCAS (2015)
Qianqian Wang, Randall L. Geiger, Degang Chen
A programmable temperature trigger circuit. ISCAS (2015)
Srijita Patra, Randall L. Geiger
Comparison of MOSFET mismatch models with random physical and random model variables. MWSCAS (2014)
Zhiqiang Liu, You Li, Randall L. Geiger, Degang Chen
Auto-identification of positive feedback loops in multi-state vulnerable circuits. VTS (2014)
Zhiqiang Liu, You Li, Yan Duan, Randall L. Geiger, Degang Chen
Identification and break of positive feedback loops in Trojan States Vulnerable Circuits. ISCAS (2014)
Rui Bai, Randall L. Geiger
Effects of non-ideal characteristics of substrate BJT on bandgap reference circuits. MWSCAS (2014)
Yen-Ting Wang, Degang Chen, Randall L. Geiger
A CMOS supply-insensitive with 13ppm/°C temperature coefficient current reference. MWSCAS (2014)
José Silva-Martínez, Edgar Sánchez-Sinencio, José G. Delgado-Frias, Randall L. Geiger
Welcome to MWSCAS 2014. MWSCAS (2014)
Qianqian Wang, Randall L. Geiger, Degang Chen
Challenges and opportunities for determining presence of multiple equilibrium points with circuit simulators. MWSCAS (2014)
Bharath Karthik Vasan, Siva Kumar Sudani, Degang Chen, Randall L. Geiger
Low-Distortion Sine Wave Generation Using a Novel Harmonic Cancellation Technique. IEEE Trans. Circuits Syst. I Regul. Pap. (5) (2013)
Chin-Wen Chen, Randall L. Geiger, Shu-Chuan Huang
A low-power supply-insensitive temperature sensor in 90nm CMOS process. MWSCAS (2013)
Chen Zhao, Yen-Ting Wang, David Genzer, Degang Chen, Randall L. Geiger
A CMOS on-chip temperature sensor with -0.21°C 0.17 °C inaccuracy from -20 °C to 100 °C. ISCAS (2013)
Siva Sudani, Degang Chen, Randall L. Geiger
High resolution ADC spectral test with known impure source and non-coherent sampling. ISCAS (2013)
Yen-Ting Wang, Degang Chen, Randall L. Geiger
Effectiveness of circuit-level continuation methods for Trojan State Elimination verification. MWSCAS (2013)
Yen-Ting Wang, Degang Chen, Randall L. Geiger
Practical methods for verifying removal of Trojan stable operating points. ISCAS (2013)
Yen-Ting Wang, Chen Zhao, Randall L. Geiger, Degang Chen, Shu-Chuan Huang
Performance verification of start-up circuits in reference generators. MWSCAS (2012)
Bharath K. Vasan, Siva Sudani, Degang Chen, Randall L. Geiger
Sinusoidal signal generation for production testing and BIST applications. ISCAS (2012)
Chen Zhao, Randall L. Geiger, Degang Chen
A compact low-power supply-insensitive CMOS current reference. ISCAS (2012)
Jingbo Duan, Degang Chen, Randall L. Geiger
A low cost method for testing offset and gain error for ADC BIST. ISCAS (2012)
Jingbo Duan, Bharath K. Vasan, Chen Zhao, Degang Chen, Randall L. Geiger
On Chip Signal Generators for Low Overhead ADC BIST. J. Electron. Test. 28 (5) (2012)
Chen Zhao, Jun He, Sheng-Huang Lee, Karl Peterson, Randall L. Geiger, Degang Chen
Linear vt-based temperature sensors with low process sensitivity and improved power supply headroom. ISCAS (2011)
Jun He, Degang Chen, Randall L. Geiger
Detailed analyses in prediction of capacitive-mismatch-induced offset in dynamic comparators. ISCAS (2010)
Jingbo Duan, Degang Chen, Randall L. Geiger
Phase control of triangular stimulus generator for ADC BIST. ISCAS (2010)
Bharath K. Vasan, Randall L. Geiger, Degang Chen
Linearity testing of ADCs using low linearity stimulus and Kalman filtering. ISCAS (2010)
Hanqing Xing, Hanjun Jiang, Degang Chen, Randall L. Geiger
High-Resolution ADC Linearity Testing Using a Fully Digital-Compatible BIST Strategy. IEEE Trans. Instrum. Meas. 58 (8) (2009)
Bharath K. Vasan, Jingbo Duan, Chen Zhao, Randall L. Geiger, Degang Chen
Signal generators for cost effective BIST of ADCs. ECCTD (2009)
Le Jin, Degang Chen, Randall L. Geiger
Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. IEEE Trans. Instrum. Meas. 58 (8) (2009)
Thu T. Duong, Degang Chen, Randall L. Geiger
Optimal Area and Impedance Allocation for Dual-string DACs. ISCAS (2009)
Jingbo Duan, Degang Chen, Randall L. Geiger
Cost Effective Signal Generators for ADC BIST. ISCAS (2009)
Jun He, Sanyi Zhan, Degang Chen, Randall L. Geiger
Analyses of Static and Dynamic Random Offset Voltages in Dynamic Comparators. IEEE Trans. Circuits Syst. I Regul. Pap. (5) (2009)
Jacob D. Sloat, Randall L. Geiger
An inexpensive microelectronic environmental test chamber. EIT (2008)
Vipul Katyal, Randall L. Geiger, Degang Chen
Adjustable hysteresis CMOS Schmitt triggers. ISCAS (2008)
Hanqing Xing, Degang Chen, Randall L. Geiger, Le Jin
System identification -based reduced-code testing for pipeline ADCs' linearity test. ISCAS (2008)
Le Jin, Hosam Haggag, Randall L. Geiger, Degang Chen
Testing of Precision DAC Using Low-Resolution ADC With Wobbling. IEEE Trans. Instrum. Meas. 57 (5) (2008)
Hanqing Xing, Degang Chen, Randall L. Geiger
On-chip at-speed linearity testing of high-resolution high-speed DACs using DDEM ADCs with dithering. EIT (2008)
Jun He, Sanyi Zhan, Degang Chen, Randall L. Geiger
A simple and accurate method to predict offset voltage in dynamic comparators. ISCAS (2008)
Hanjun Jiang, Beatriz Olleta, Degang Chen, Randall L. Geiger
Testing High-Resolution ADCs With Low-Resolution/Accuracy Deterministic Dynamic Element Matched DACs. IEEE Trans. Instrum. Meas. 56 (5) (2007)
Haibo Fei, Randall L. Geiger
Linear Current Division Principles. ISCAS (2007)
Hanjun Jiang, Degang Chen, Randall L. Geiger
Deterministic DEM DAC Performance Analysis. ISCAS (2007)
Le Jin, Degang Chen, Randall L. Geiger
SEIR Linearity Testing of Precision A/D Converters in Nonstationary Environments With Center-Symmetric Interleaving. IEEE Trans. Instrum. Meas. 56 (5) (2007)
Hanqing Xing, Hanjun Jiang, Degang Chen, Randall L. Geiger
A fully digital-compatible BIST strategy for ADC linearity testing. ITC (2007)
Le Jin, Degang Chen, Randall L. Geiger
Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. VTS (2007)
Le Jin, Hanqing Xing, Degang Chen, Randall L. Geiger
A self-calibrated bandgap voltage reference with 0.5 ppm/°C temperature coefficient. ISCAS (2006)
Yu Lin, Degang Chen, Randall L. Geiger
Yield enhancement with optimal area allocation for ratio-critical analog circuits. IEEE Trans. Circuits Syst. I Regul. Pap. (3) (2006)
Hanqing Xing, Degang Chen, Randall L. Geiger
Linearity test for high resolution DACs using low-accuracy DDEM flash ADCs. ISCAS (2006)
Vipul Katyal, Randall L. Geiger, Degang Chen
A New High Precision Low Offset Dynamic Comparator for High Resolution High Speed ADCs. APCCAS (2006)
Chao Su, Randall L. Geiger
Dynamic calibration of current-steering DAC. ISCAS (2006)
Kazuyuki Wada, Randall L. Geiger
Minimization of total area in integrated active RC filters. ISCAS (2006)
Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger
A deterministic dynamic element matching approach for testing high-resolution ADCs with low-accuracy excitations. IEEE Trans. Instrum. Meas. 55 (3) (2006)
Le Jin, Hosam Haggag, Randall L. Geiger, Degang Chen
Testing of Precision DACs Using Low-Resolution ADCs with Dithering. ITC (2006)
Hanqing Xing, Le Jin, Degang Chen, Randall L. Geiger
Characterization of a current-mode bandgap circuit structure for high-precision reference applications. ISCAS (2006)
Yu Lin, Randall L. Geiger
Unit resistor characterization for matching-critical circuit design. ISCAS (2006)
Xin Dai, Degang Chen, Randall L. Geiger
Explicit characterization of bandgap references. ISCAS (2006)
Le Jin, Degang Chen, Randall L. Geiger
Linearity Test of Analog-to-Digital Converters Using Kalman Filtering. ITC (2006)
Hanqing Xing, Degang Chen, Randall L. Geiger
A two-step DDEM ADC for accurate and cost-effective DAC testing. ISCAS (5) (2005)
Xin Dai, Chengming He, Hanqing Xing, Degang Chen, Randall L. Geiger
order central symmetrical layout pattern for nonlinear gradients cancellation. ISCAS (5) (2005)
Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger
A segmented thermometer coded DAC with deterministic dynamic element matching for high resolution ADC test. ISCAS (1) (2005)
Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Randall L. Geiger, Degang Chen
High-performance ADC linearity test using low-precision signals in non-stationary environments. ITC (2005)
Degang Chen, Zhongjun Yu, Randall L. Geiger
An adaptive, truly background calibration method for high speed pipeline ADC design. ISCAS (6) (2005)
Le Jin, Degang Chen, Randall L. Geiger
A digital self-calibration algorithm for ADCs based on histogram test using low-linearity input signals. ISCAS (2) (2005)
Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger
Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal. IEEE Trans. Instrum. Meas. 54 (3) (2005)
Yu Lin, Vipul Katyal, Mark Schlarmann, Randall L. Geiger
kT/C constrained optimization of power in pipeline ADCs. ISCAS (3) (2005)
Hanjun Jiang, Degang Chen, Randall L. Geiger
Dither incorporated deterministic dynamic element matching for high resolution ADC test using extremely low resolution DACs. ISCAS (5) (2005)
Wenbo Liu, Hanqing Xing, Le Jin, Randall L. Geiger, Degang Chen
A test strategy for time-to-digital converters using dynamic element matching and dithering. ISCAS (4) (2005)
Sreenath Thoka, Randall L. Geiger
Fast-switching adaptive bandwidth frequency synthesizer using a loop filter with switched zero-resistor array. ISCAS (6) (2005)
Kumar L. Parthasarathy, Turker Kuyel, Zhongjun Yu, Degang Chen, Randall L. Geiger
A 16-bit resistor string DAC with full-calibration at final test. ITC (2005)
Yu Lin, Vipul Katyal, Randall L. Geiger
Power dependence of feedback amplifiers on opamp architecture. ISCAS (2) (2005)
Zhongjun Yu, Degang Chen, Randall L. Geiger, Ioannis Papantonopoulos
Pipeline ADC linearity testing with dramatically reduced data capture time. ISCAS (1) (2005)
Xin Dai, Degang Chen, Randall L. Geiger
A cost-effective histogram test-based algorithm for digital calibration of high-precision pipelined ADCs. ISCAS (5) (2005)
Zhongjun Yu, Degang Chen, Randall L. Geiger
Accurate testing of ADC's spectral performance using imprecise sinusoidal excitations. ISCAS (1) (2004)
Zhongjun Yu, Degang Chen, Randall L. Geiger
A Computationally Efficient Method for Accurate Spectral Testing without Requiring Coherent Sampling. ITC (2004)
Zhongjun Yu, Degang Chen, Randall L. Geiger
The SRE/SRM approach for spectral testing of AMS circuits. ISCAS (1) (2004)
Chengming He, Le Jin, Degang Chen, Randall L. Geiger
Robust design of high gain amplifiers using dynamical systems and bifurcation theory. ISCAS (1) (2004)
Le Jin, Chengming He, Degang Chen, Randall L. Geiger
An SoC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli. ISCAS (1) (2004)
Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger
Parameter optimization of deterministic dynamic element matching DACs for accurate and cost-effective ADC testing. ISCAS (1) (2004)
Chengming He, Kuangming Yap, Degang Chen, Randall L. Geiger
order circular symmetry pattern and hexagonal tesselation: two new layout techniques cancelling nonlinear gradient. ISCAS (1) (2004)
Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger
Testing high resolution ADCs using deterministic dynamic element matching. ISCAS (1) (2004)
Le Jin, Chengming He, Degang Chen, Randall L. Geiger
Fast implementation of a linearity test approach for high-resolution ADCs using non-linear ramp signals. ISCAS (1) (2004)

Randall L. Geiger.css-eqlu8i{font-size:small;padding-left:4px;}

Publication Activity (10 Years)

Top Topics

Top Venues

Randall L. Geiger