On Chip Signal Generators for Low Overhead ADC BIST.
Jingbo DuanBharath K. VasanChen ZhaoDegang ChenRandall L. GeigerPublished in: J. Electron. Test. (2012)
Keyphrases
- low overhead
- sigma delta
- high reliability
- built in self test
- load balancing
- dynamic range
- wide dynamic range
- low cost
- communication cost
- single chip
- signal processing
- high speed
- energy efficient
- wireless sensor networks
- shared memory
- image sensor
- distributed systems
- transfer function
- multi dimensional
- analog to digital converter