Linearity test for high resolution DACs using low-accuracy DDEM flash ADCs.
Hanqing XingDegang ChenRandall L. GeigerPublished in: ISCAS (2006)
Keyphrases
- high resolution
- false positive and false negative
- high accuracy
- fold cross validation
- prediction accuracy
- low resolution
- computational cost
- super resolution
- image processing
- classification accuracy
- real time
- remote sensing
- high frequency
- highly accurate
- neural network
- computational complexity
- field of view
- wireless communication