A deterministic dynamic element matching approach for testing high-resolution ADCs with low-accuracy excitations.
Beatriz OlletaHanjun JiangDegang ChenRandall L. GeigerPublished in: IEEE Trans. Instrum. Meas. (2006)
Keyphrases
- high resolution
- high accuracy
- low resolution
- image processing
- matching algorithm
- pattern matching
- prediction accuracy
- image matching
- high precision
- high frequency
- super resolution
- computational cost
- matching accuracy
- data sets
- error rate
- depth map
- software testing
- satellite images
- computational efficiency
- remote sensing
- keypoints
- neural network