A two-step DDEM ADC for accurate and cost-effective DAC testing.

Hanqing Xing Degang Chen Randall L. Geiger

Published in: ISCAS (5) (2005)

Keyphrases

cost effective
low cost
cost effectiveness
post processing
test cases
computationally efficient
high precision
small businesses
long term
high accuracy
high speed
test set
information and communication technologies