A low cost method for testing offset and gain error for ADC BIST.
Jingbo DuanDegang ChenRandall L. GeigerPublished in: ISCAS (2012)
Keyphrases
- low cost
- error rate
- test data
- cost function
- feature selection
- high precision
- relative error
- highly efficient
- detection method
- theoretical analysis
- computational cost
- computational complexity
- support vector machine svm
- high accuracy
- synthetic data
- classification accuracy
- high order
- error analysis
- quantization error
- real time