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USER-SMILE: Ultrafast Stimulus Error Removal and Segmented Model Identification of Linearity Errors for ADC Built-in Self-Test.
Tao Chen
Xiankun Jin
Randall L. Geiger
Degang Chen
Published in:
IEEE Trans. Circuits Syst. I Regul. Pap. (2018)
Keyphrases
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probabilistic model
high level
theoretical analysis
theoretical framework
systematic errors
management system
least squares
access control
em algorithm
user interaction
error rate
context dependent
lower order