Xiankun Jin

Publication Activity (10 Years)

Years Active: 2014-2024
Publications (10 Years): 5

Top Topics

Leakage Current

Silicon Dioxide

Top Venues

IEEE Trans. Circuits Syst. I Regul. Pap.

IEEE Trans. Circuits Syst. II Express Briefs

Publications

Ayush Arunachalam, Ian Kintz, Suvadeep Banerjee, Arnab Raha, Xiankun Jin, Fei Su, Viswanathan Pillai Prasanth, Rubin A. Parekhji, Suriyaprakash Natarajan, Kanad Basu
Enhancing Functional Safety in Automotive AMS Circuits through Unsupervised Machine Learning. CoRR (2024)
Ayush Arunachalam, Sanjay Das, Monikka Rajan, Fei Su, Xiankun Jin, Suvadeep Banerjee, Arnab Raha, Suriyaprakash Natarajan, Kanad Basu
Enhanced ML-Based Approach for Functional Safety Improvement in Automotive AMS Circuits. ITC (2023)
Kushagra Bhatheja, Xiankun Jin, Matthew Strong, Degang Chen
Fast Gate Leakage Current Monitor With Large Dynamic Range. IEEE Trans. Circuits Syst. II Express Briefs 68 (5) (2021)
Tao Chen, Xiankun Jin, Randall L. Geiger, Degang Chen
USER-SMILE: Ultrafast Stimulus Error Removal and Segmented Model Identification of Linearity Errors for ADC Built-in Self-Test. IEEE Trans. Circuits Syst. I Regul. Pap. (7) (2018)
Xiankun Jin, Tao Chen, Mayank Jain, Arun Kumar Barman, David Kramer, Doug Garrity, Randall L. Geiger, Degang Chen
An on-chip ADC BIST solution and the BIST enabled calibration scheme. ITC (2017)
Xiankun Jin, Nan Sun
Low-cost high-quality constant offset injection for SEIR-based ADC built-in-self-test. ISCAS (2014)