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An on-chip ADC BIST solution and the BIST enabled calibration scheme.
Xiankun Jin
Tao Chen
Mayank Jain
Arun Kumar Barman
David Kramer
Doug Garrity
Randall L. Geiger
Degang Chen
Published in:
ITC (2017)
Keyphrases
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built in self test
low cost
high density
linear equations
high speed
integrated circuit
real time
image processing
objective function
search algorithm
camera network
single chip
numerical scheme
vlsi implementation
learning automaton