Tao Chen

Publication Activity (10 Years)

Years Active: 2015-2020
Publications (10 Years): 14

Top Topics

Calibration Method

Measurement Error

Top Venues

IEEE Trans. Instrum. Meas.

Publications

Chulhyun Park, Tao Chen, Kyoohyun Noh, Dadian Zhou, Suraj Prakash, Mohammadhossein Naderi Alizadeh, Aydin I. Karsilayan, Degang Chen, Randall L. Geiger, José Silva-Martínez
A 12-Bit 125-MS/s 2.5-Bit/Cycle SAR-Based Pipeline ADC Employing a Self-Biased Gain Boosting Amplifier. IEEE Trans. Circuits Syst. (11) (2020)
Tao Chen, Chulhyun Park, Shravan K. Chaganti, José Silva-Martínez, Randall L. Geiger, Degang Chen
An Ultrafast Multibit/Stage Pipelined ADC Testing and Calibration Method. IEEE Trans. Instrum. Meas. 69 (3) (2020)
Tao Chen, Chulhyun Park, Hao Meng, Dadian Zhou, José Silva-Martínez, Randall L. Geiger, Degang Chen
A Low-Cost On-Chip Built-In Self-Test Solution for ADC Linearity Test. IEEE Trans. Instrum. Meas. 69 (6) (2020)
Tao Chen, Degang Chen
Built-in self-test and self-calibration for analog and mixed signal circuits. ITC (2019)
Tao Chen, Xiankun Jin, Randall L. Geiger, Degang Chen
USER-SMILE: Ultrafast Stimulus Error Removal and Segmented Model Identification of Linearity Errors for ADC Built-in Self-Test. IEEE Trans. Circuits Syst. I Regul. Pap. (7) (2018)
Shravan K. Chaganti, Tao Chen, Yuming Zhuang, Degang Chen
Low-cost and accurate DAC linearity test with ultrafast segmented model identification of linearity errors and removal of measurement errors (uSMILE-ROME). I2MTC (2018)
Yuming Zhuang, Benjamin Magstadt, Tao Chen, Degang Chen
High-Purity Sine Wave Generation Using Nonlinear DAC With Predistortion Based on Low-Cost Accurate DAC-ADC Co-Testing. IEEE Trans. Instrum. Meas. 67 (2) (2018)
Xiankun Jin, Tao Chen, Mayank Jain, Arun Kumar Barman, David Kramer, Doug Garrity, Randall L. Geiger, Degang Chen
An on-chip ADC BIST solution and the BIST enabled calibration scheme. ITC (2017)
Yan Duan, Tao Chen, Degang Chen
A Low-cost Dithering Method for Improving ADC Linearity Test Applied in uSMILE Algorithm. J. Electron. Test. 33 (6) (2017)
Yan Duan, Tao Chen, Degang Chen
Low-cost dithering generator for accurate ADC linearity test. ISCAS (2016)
Yuming Zhuang, Tao Chen, Shravan K. Chaganti, Degang Chen
Accurate linearity testing with impure sinusoidal stimulus robust against flicker noise. VTS (2016)
Tao Chen, Degang Chen
Ultrafast stimulus error removal algorithm for ADC linearity test. VTS (2015)
Yuming Zhuang, Tao Chen, Shravan K. Chaganti, Degang Chen
Effect of flicker noise on SEIR for accurate ADC linearity testing. MWSCAS (2015)
Yan Duan, Tao Chen, Zhiqiang Liu, Xu Zhang, Degang Chen
High-constancy offset generator robust to CDAC nonlinearity for SEIR-based ADC BIST. ISCAS (2015)