Effect of flicker noise on SEIR for accurate ADC linearity testing.
Yuming ZhuangTao ChenShravan K. ChagantiDegang ChenPublished in: MWSCAS (2015)
Keyphrases
- high accuracy
- noise level
- low cost
- computationally efficient
- noise reduction
- high quality
- signal to noise ratio
- noisy environments
- image processing
- noise model
- additive noise
- noisy data
- random noise
- neural network
- software testing
- statistical tests
- missing data
- image registration
- information systems
- learning algorithm