Shravan K. Chaganti

Publication Activity (10 Years)

Years Active: 2015-2024
Publications (10 Years): 24

Top Topics

Regularized Kernel

Measurement Errors

Fish Eye Lenses

Linear Least Squares

Top Venues

Publications

Kushagra Bhatheja, Shravan K. Chaganti, Johnathan Leisinger, Emmanuel Nti Darko, Isaac Bruce, Degang Chen
A BIST Approach to Approximate Co-Testing of Embedded Data Converters. IEEE Des. Test 41 (3) (2024)
Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing. J. Electron. Test. 39 (1) (2023)
Daniel Adjei, Bryce Gadogbe, Degang Chen, Randall L. Geiger, Shravan K. Chaganti, Dhyey Desai, Jerry Doorenbos, Jim Todsen
Order-Compensated Bandgap References. MWSCAS (2023)
Praise O. Farayola, Ekaniyere Oko-Odion, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
Site-to-Site Variation in Analog Multisite Testing: A Survey on Its Detection and Correction. IEEE Des. Test 40 (5) (2023)
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
Cross-Correlation Approach to Detecting Issue Test Sites in Massive Parallel Testing. DFT (2022)
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing. J. Electron. Test. 38 (6) (2022)
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
Optimal Order Polynomial Transformation for Calibrating Systematic Errors in Multisite Testing. ITC (2022)
Kushagra Bhatheja, Shravan K. Chaganti, Degang Chen, Xiankun Robert Jin, Chris C. Dao, Juxiang Ren, Abhishek Kumar, Daniel Correa, Mark Lehmann, Thomas Rodriguez, Eric Kingham, Joel R. Knight, Allan Dobbin, Scott W. Herrin, Doug Garrity
Low Cost High Accuracy Stimulus Generator for On-chip Spectral Testing. ITC (2022)
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
The Least-Squares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing. VTS (2022)
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
Systematic Hardware Error Identification and Calibration for Massive Multisite Testing. ITC (2021)
Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
Detection of Site to Site Variations From Volume Measurement Data in Multisite Semiconductor Testing. IEEE Trans. Instrum. Meas. 70 (2021)
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
Massive Multisite Variability-Aware Die Distribution Estimation for Analog/Mixed-Signal Circuits Test Validation. DTIS (2021)
Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
An Ordinal Optimization-Based Approach To Die Distribution Estimation For Massive Multi-site Testing Validation: A Case Study. ETS (2021)
Tao Chen, Chulhyun Park, Shravan K. Chaganti, José Silva-Martínez, Randall L. Geiger, Degang Chen
An Ultrafast Multibit/Stage Pipelined ADC Testing and Calibration Method. IEEE Trans. Instrum. Meas. 69 (3) (2020)
Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
Quantile - Quantile Fitting Approach to Detect Site to Site Variations in Massive Multi-site Testing. VTS (2020)
Shravan K. Chaganti, Tao Chen, Yuming Zhuang, Degang Chen
Low-cost and accurate DAC linearity test with ultrafast segmented model identification of linearity errors and removal of measurement errors (uSMILE-ROME). I2MTC (2018)
Shravan K. Chaganti, Abalhassan Sheikh, Sumit Dubey, Frank Ankapong, Nitin Agarwal, Degang Chen
Fast and accurate linearity test for DACs with various architectures using segmented models. ITC (2018)
Zhiqiang Liu, Shravan K. Chaganti, Degang Chen
Improving Time-Efficiency of Fault-Coverage Simulation for MOS Analog Circuit. IEEE Trans. Circuits Syst. I Regul. Pap. (5) (2018)
Nanqi Liu, Shravan K. Chaganti, Zhiqiang Liu, Degang Chen, Amitava Majumdar
Concurrent Sampling with Local Digitization - An Alternative to Analog Test Bus. ISCAS (2018)
Shravan K. Chaganti, Li Xu, Degang Chen
A low-cost jitter separation and ADC spectral testing method without requiring coherent sampling. ISCAS (2018)
Zhiqiang Liu, Nanqi Liu, Shravan K. Chaganti, Degang Chen, Amitava Majumdar
A digital clock-less pulse stretcher with application in deep sub-nanosecond pulse detection. ISCAS (2017)
Shravan K. Chaganti, Li Xu, Degang Chen
A low-cost method for separation and accurate estimation of ADC noise, aperture jitter, and clock jitter. VTS (2017)
Zhiqiang Liu, Shravan K. Chaganti, Degang Chen
Toward complete analog fault coverage with minimal observation points using a fault propagation graph. ISCAS (2016)
Yuming Zhuang, Tao Chen, Shravan K. Chaganti, Degang Chen
Accurate linearity testing with impure sinusoidal stimulus robust against flicker noise. VTS (2016)
Yuming Zhuang, Tao Chen, Shravan K. Chaganti, Degang Chen
Effect of flicker noise on SEIR for accurate ADC linearity testing. MWSCAS (2015)