The Least-Squares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing.
Praise O. FarayolaIsaac BruceShravan K. ChagantiAbalhassan SheikhSrivaths RaviDegang ChenPublished in: VTS (2022)
Keyphrases
- least squares
- error analysis
- linear least squares
- robust estimation
- error minimization
- error rate
- camera calibration
- error bounds
- parameter estimation
- test set
- automatic identification
- optical flow
- hand eye coordination
- levenberg marquardt
- bundle adjustment
- generalization error
- prediction error
- camera parameters
- estimation error
- stereo camera
- test data
- error function
- test cases
- gaze tracking
- image restoration
- d objects
- image sequences