Isaac Bruce

Publication Activity (10 Years)

Years Active: 2021-2024
Publications (10 Years): 12

Top Topics

Geographically Distributed

Hand Eye Coordination

Top Venues

J. Electron. Test.

Publications

Kushagra Bhatheja, Shravan K. Chaganti, Johnathan Leisinger, Emmanuel Nti Darko, Isaac Bruce, Degang Chen
A BIST Approach to Approximate Co-Testing of Embedded Data Converters. IEEE Des. Test 41 (3) (2024)
Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing. J. Electron. Test. 39 (1) (2023)
Michael Sekyere, Emmanuel Nti Darko, Isaac Bruce, Ekaniyere Oko-Odion, Kushagra Bhatheja, Degang Chen
Ultra-Small Area, Highly Linear Sub-Radix R-2R Digital-To-Analog Converters with Novel Calibration Algorithm. MWSCAS (2023)
Isaac Bruce, Michael Sekyere, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Kushagra Bhatheja, Degang Chen
Small Area, High Accuracy Sub-Radix Resistive Current Mode Digital-To-Analog Converter with Novel Calibration Algorithm. MWSCAS (2023)
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
Cross-Correlation Approach to Detecting Issue Test Sites in Massive Parallel Testing. DFT (2022)
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing. J. Electron. Test. 38 (6) (2022)
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
Optimal Order Polynomial Transformation for Calibrating Systematic Errors in Multisite Testing. ITC (2022)
Abraham Steenhoek, Praise O. Farayola, Isaac Bruce, Shravan Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
Graph Theory Approach for Multi-site ATE Board Parameter Extraction. ETS (2022)
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
The Least-Squares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing. VTS (2022)
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
Systematic Hardware Error Identification and Calibration for Massive Multisite Testing. ITC (2021)
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
Massive Multisite Variability-Aware Die Distribution Estimation for Analog/Mixed-Signal Circuits Test Validation. DTIS (2021)
Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
An Ordinal Optimization-Based Approach To Die Distribution Estimation For Massive Multi-site Testing Validation: A Case Study. ETS (2021)