Abalhassan Sheikh

Publication Activity (10 Years)

Years Active: 2018-2023
Publications (10 Years): 13

Top Topics

Measurement Data

Central Limit Theorem

Regularized Kernel

Top Venues

J. Electron. Test.

Publications

Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing. J. Electron. Test. 39 (1) (2023)
Praise O. Farayola, Ekaniyere Oko-Odion, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
Site-to-Site Variation in Analog Multisite Testing: A Survey on Its Detection and Correction. IEEE Des. Test 40 (5) (2023)
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
Cross-Correlation Approach to Detecting Issue Test Sites in Massive Parallel Testing. DFT (2022)
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing. J. Electron. Test. 38 (6) (2022)
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
Optimal Order Polynomial Transformation for Calibrating Systematic Errors in Multisite Testing. ITC (2022)
Abraham Steenhoek, Praise O. Farayola, Isaac Bruce, Shravan Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
Graph Theory Approach for Multi-site ATE Board Parameter Extraction. ETS (2022)
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
The Least-Squares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing. VTS (2022)
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
Systematic Hardware Error Identification and Calibration for Massive Multisite Testing. ITC (2021)
Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
Detection of Site to Site Variations From Volume Measurement Data in Multisite Semiconductor Testing. IEEE Trans. Instrum. Meas. 70 (2021)
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
Massive Multisite Variability-Aware Die Distribution Estimation for Analog/Mixed-Signal Circuits Test Validation. DTIS (2021)
Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
An Ordinal Optimization-Based Approach To Die Distribution Estimation For Massive Multi-site Testing Validation: A Case Study. ETS (2021)
Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
Quantile - Quantile Fitting Approach to Detect Site to Site Variations in Massive Multi-site Testing. VTS (2020)
Shravan K. Chaganti, Abalhassan Sheikh, Sumit Dubey, Frank Ankapong, Nitin Agarwal, Degang Chen
Fast and accurate linearity test for DACs with various architectures using segmented models. ITC (2018)