Fast and accurate linearity test for DACs with various architectures using segmented models.
Shravan K. ChagantiAbalhassan SheikhSumit DubeyFrank AnkapongNitin AgarwalDegang ChenPublished in: ITC (2018)
Keyphrases
- accurate models
- probabilistic model
- machine learning
- statistical tests
- data mining
- mathematical models
- high precision
- test data
- artificial neural networks
- software development
- computationally efficient
- parameter estimation
- machine learning algorithms
- complex systems
- high quality
- three dimensional
- social networks
- search engine
- database