A BIST Approach to Approximate Co-Testing of Embedded Data Converters.
Kushagra BhathejaShravan K. ChagantiJohnathan LeisingerEmmanuel Nti DarkoIsaac BruceDegang ChenPublished in: IEEE Des. Test (2024)
Keyphrases
- training data
- experimental data
- data sources
- data sets
- image data
- input data
- data collection
- databases
- data analysis
- data quality
- multimedia data
- test data
- statistical analysis
- complex data
- noisy data
- raw data
- data distribution
- application domains
- missing data
- case study
- data processing
- database
- data mining techniques
- small number
- high quality
- data points
- data structure
- prior knowledge