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Improving Time-Efficiency of Fault-Coverage Simulation for MOS Analog Circuit.

Zhiqiang LiuShravan K. ChagantiDegang Chen
Published in: IEEE Trans. Circuits Syst. I Regul. Pap. (2018)
Keyphrases
  • analog circuits
  • fault diagnosis
  • simulation model
  • wavelet packet transform
  • real time
  • mathematical model
  • computer vision
  • pattern recognition
  • np complete