A Low-cost Dithering Method for Improving ADC Linearity Test Applied in uSMILE Algorithm.
Yan DuanTao ChenDegang ChenPublished in: J. Electron. Test. (2017)
Keyphrases
- experimental evaluation
- high accuracy
- dynamic programming
- cost function
- detection algorithm
- improved algorithm
- preprocessing
- detection method
- low cost
- objective function
- optimization algorithm
- optimization method
- computationally efficient
- significant improvement
- convergence rate
- energy function
- computational complexity
- similarity measure
- classification method
- theoretical analysis
- tree structure
- estimation algorithm
- computational cost
- segmentation algorithm
- highly efficient
- computational efficiency
- matching algorithm
- classification algorithm
- clustering method
- support vector machine svm
- synthetic and real images
- selection algorithm
- em algorithm
- pairwise
- k means
- region of interest
- reconstruction method
- recognition algorithm
- high efficiency
- single pass
- neural network
- segmentation method
- probabilistic model
- optimal solution
- learning algorithm
- mathematical model
- particle swarm optimization
- evolutionary algorithm
- genetic algorithm
- real time
- quantization error