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A Low-Cost On-Chip Built-In Self-Test Solution for ADC Linearity Test.
Tao Chen
Chulhyun Park
Hao Meng
Dadian Zhou
José Silva-Martínez
Randall L. Geiger
Degang Chen
Published in:
IEEE Trans. Instrum. Meas. (2020)
Keyphrases
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built in self test
low cost
integrated circuit
single chip
closed form
low power
linear equations
real time
control system
signal processing
mathematical model
solution quality
hardware and software