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A Low-Cost On-Chip Built-In Self-Test Solution for ADC Linearity Test.

Tao ChenChulhyun ParkHao MengDadian ZhouJosé Silva-MartínezRandall L. GeigerDegang Chen
Published in: IEEE Trans. Instrum. Meas. (2020)
Keyphrases
  • built in self test
  • low cost
  • integrated circuit
  • single chip
  • closed form
  • low power
  • linear equations
  • real time
  • control system
  • signal processing
  • mathematical model
  • solution quality
  • hardware and software