Built-in self-test and self-calibration for analog and mixed signal circuits.
Tao ChenDegang ChenPublished in: ITC (2019)
Keyphrases
- mixed signal
- built in self test
- low power
- multi channel
- vlsi circuits
- digital circuits
- integrated circuit
- cmos technology
- power consumption
- focal length
- low cost
- camera calibration
- high speed
- camera parameters
- multiple views
- low voltage
- camera motion
- structure from motion
- power dissipation
- single chip
- image sequences
- analog to digital converter