FOCAL LENGTH
Experts
- Marc Pollefeys
- Tomás Pajdla
- Xiaoxiong Xiong
- Luc Van Gool
- Peter F. Sturm
- Zhanyi Hu
- Nassir Navab
- Anders Heyden
- Zuzana Kukelova
- Hongdong Li
- Roberto Cipolla
- Davide Scaramuzza
- Reinhard Koch
- Kalle Åström
- Helder Araújo
- Roland Siegwart
- Hideo Saito
- In-So Kweon
- Laurent Kneip
- Yuchao Dai
- Guanghui Wang
- Hongbin Zha
- Yeong Min Jang
- Xianghua Ying
- Alessio Del Bue
- Kwan-Yee Kenneth Wong
- João Pedro Barreto
- Fredrik Kahl
- Gim Hee Lee
- Richard I. Hartley
- Atsushi Yamashita
- Levente Hajder
- Hui Zhang
- Juho Kannala
- Hajime Asama
- Pedro Miraldo
- Jean-Marc Lavest
- Janne Heikkilä
- Yihong Wu
Venues
- CoRR
- Sensors
- ICRA
- CVPR
- IROS
- IEEE Trans. Instrum. Meas.
- IGARSS
- Remote. Sens.
- ICCV
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Access
- ICIP
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICPR
- BMVC
- IEEE Robotics Autom. Lett.
- Int. J. Comput. Vis.
- CVPR Workshops
- ROBIO
- Comput. Vis. Image Underst.
- Pattern Recognit.
- ICASSP
- Image Vis. Comput.
- Pattern Recognit. Lett.
- WACV
- ISCAS
- Multim. Tools Appl.
- ITSC
- Mach. Vis. Appl.
- IEEE J. Solid State Circuits
- MVA
- IEEE Trans. Circuits Syst. Video Technol.
- ICCV Workshops
- IEEE Trans. Image Process.
- IEEE Trans. Circuits Syst. II Express Briefs
- ICPR (1)
- IEEE Geosci. Remote. Sens. Lett.
- EMBC
- EUSIPCO
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