Le Jin

Publication Activity (10 Years)

Years Active: 2003-2023
Publications (10 Years): 2

Top Topics

Monocular Images

Articulated Model

Top Venues

Publications

Teng Zhang, Minghui Yang, Le Jin, Guoshun Zhou, Xuefeng Zhao, Chao Shi, Xingyu Yuan, Liang Zhou, Liang Chang, Jun Zhou
A FPGA-Based Iterative 6DoF Pose Refinement Processing Unit for Fast and Energy-Efficient Pose Estimation in Picking Robots. IECON (2023)
Yinan Zhang, Huiqi Hu, Xuan Zhou, Enlong Xie, Hongdi Ren, Le Jin
PM-Blade: A Persistent Memory Augmented LSM-tree Storage for Database. ICDE (2023)
Jingbo Duan, Le Jin, Degang Chen
Testing ADC Spectral Performance Without Dedicated Data Acquisition. IEEE Trans. Instrum. Meas. 61 (11) (2012)
Le Jin
Application of the Kalman Filter in Linearity Testing of Analog-to-Digital Converters. J. Electron. Test. 27 (2) (2011)
Le Jin, Lin Liang
A power-of-two FFT algorithm and structure for DRM receiver. IEEE Trans. Consumer Electron. 56 (4) (2010)
Jingbo Duan, Le Jin, Degang Chen
INL based dynamic performance estimation for ADC BIST. ISCAS (2010)
Jingbo Duan, Le Jin, Degang Chen
A new method for estimating spectral performance of ADC from INL. ITC (2010)
Sehun Kook, Hyun Woo Choi, Vishwanath Natarajan, Abhijit Chatterjee, Alfred V. Gomes, Shalabh Goyal, Le Jin
Low Cost Dynamic Test Methodology for High Precision ΣD ADCs. Asian Test Symposium (2009)
Jin Yu, Limin Zhi, Yunming Qiu, Le Jin, Hailu Du
Grey Synthetical Prediction Model of Military Logistics Based on Evolutionary Neural Network. CSO (1) (2009)
Le Jin, Degang Chen, Randall L. Geiger
Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. IEEE Trans. Instrum. Meas. 58 (8) (2009)
Sehun Kook, Vishwanath Natarajan, Abhijit Chatterjee, Shalabh Goyal, Le Jin
Testing of High Resolution ADCs Using Lower Resolution DACs via Iterative Transfer Function Estimation. ETS (2009)
Le Jin
Linearity Test Time Reduction for Analog-to-Digital Converters Using the Kalman Filter with Experimental Parameter Estimation. ITC (2008)
Hanqing Xing, Degang Chen, Randall L. Geiger, Le Jin
System identification -based reduced-code testing for pipeline ADCs' linearity test. ISCAS (2008)
Le Jin, Hosam Haggag, Randall L. Geiger, Degang Chen
Testing of Precision DAC Using Low-Resolution ADC With Wobbling. IEEE Trans. Instrum. Meas. 57 (5) (2008)
Liang Chen, Le Jin, Feng He, Hanwen Cheng, Lenan Wu
Dynamic Network Selection for Multicast Services in Wireless Cooperative Networks. IEICE Trans. Commun. (10) (2008)
Le Jin, Degang Chen, Randall L. Geiger
SEIR Linearity Testing of Precision A/D Converters in Nonstationary Environments With Center-Symmetric Interleaving. IEEE Trans. Instrum. Meas. 56 (5) (2007)
Le Jin, Degang Chen, Randall L. Geiger
Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. VTS (2007)
Chengming He, Le Jin, Degang Chen, Randy Geiger
Robust High-Gain Amplifier Design Using Dynamical Systems and Bifurcation Theory With Digital Postprocessing Techniques. IEEE Trans. Circuits Syst. I Regul. Pap. (5) (2007)
Le Jin, Hanqing Xing, Degang Chen, Randall L. Geiger
A self-calibrated bandgap voltage reference with 0.5 ppm/°C temperature coefficient. ISCAS (2006)
Le Jin, Hosam Haggag, Randall L. Geiger, Degang Chen
Testing of Precision DACs Using Low-Resolution ADCs with Dithering. ITC (2006)
Hanqing Xing, Le Jin, Degang Chen, Randall L. Geiger
Characterization of a current-mode bandgap circuit structure for high-precision reference applications. ISCAS (2006)
Le Jin, Degang Chen, Randall L. Geiger
Linearity Test of Analog-to-Digital Converters Using Kalman Filtering. ITC (2006)
Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Randall L. Geiger, Degang Chen
High-performance ADC linearity test using low-precision signals in non-stationary environments. ITC (2005)
Le Jin, Degang Chen, Randall L. Geiger
A digital self-calibration algorithm for ADCs based on histogram test using low-linearity input signals. ISCAS (2) (2005)
Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger
Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal. IEEE Trans. Instrum. Meas. 54 (3) (2005)
Wenbo Liu, Hanqing Xing, Le Jin, Randall L. Geiger, Degang Chen
A test strategy for time-to-digital converters using dynamic element matching and dithering. ISCAS (4) (2005)
Chengming He, Le Jin, Degang Chen, Randall L. Geiger
Robust design of high gain amplifiers using dynamical systems and bifurcation theory. ISCAS (1) (2004)
Le Jin, Chengming He, Degang Chen, Randall L. Geiger
An SoC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli. ISCAS (1) (2004)
Le Jin, Chengming He, Degang Chen, Randall L. Geiger
Fast implementation of a linearity test approach for high-resolution ADCs using non-linear ramp signals. ISCAS (1) (2004)
Kumar L. Parthasarathy, Le Jin, Turker Kuyel, Dana Price, Degang Chen, Randall L. Geiger
Experimental evaluation and validation of a BIST algorithm for characterization of A/D converter performance. ISCAS (5) (2003)
Kumar L. Parthasarathy, Turker Kuyel, Dana Price, Le Jin, Degang Chen, Randall L. Geiger
BIST and production testing of ADCs using imprecise stimulus. ACM Trans. Design Autom. Electr. Syst. 8 (4) (2003)
Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger
Linearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear Inputs. ITC (2003)